Used Metrology and inspection equipment
1,302 resultsBinocular Angle 45° Eyepieces Magnification 10 X Field Number 21 mm Focusing YES Magnification Ran Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicromanipulator System [Configuration/Specifications] ・Manipulator (left and right arms): Operating ran Location : ASIA (North East)
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More detailsModel type: Type2/103 (tip tip nominal diameter φ30μm) Measurement range: UMAP 185 x Y200 x Z175mm Image probe Location : ASIA (North East)
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More detailsHg-CV measurement system Version: up to 12 inch Vintage: 01.01.2004 - Capable up to 12" Wafer - SSM 52 Capac Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More details8″ uv flood exposure system, cassette to cassette. Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield, Darkfield & DIC Illumination Type Reflected & Transmitted Light Trinoc Location : AMERICA North (USA-Canada-Mexico)
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More details300mm (12″ INCH) CHUCK 300mm (12″ INCH) X 300mm (12″ INCH) TRAVEL ANORAD TABLE NEW MOTORS (covered by 6 month Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe Model DE3496 provides particle concentrations per in.2 or cm2 in five sizes from 0.3 µm to 10 µm. It mea Location : AMERICA North (USA-Canada-Mexico)
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More detailsRUCKER AND KOLLS 250 4″ PROBE STATION 4×4 travel with 4″ chuck includes B&L zoom 4 optics Location : AMERICA North (USA-Canada-Mexico)
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More details4″ PROBE STATION WITH 4″ CHUCK, 4X4″ TRAVEL INCLUDES STEREO ZOOM OPTICS AND LED RING ILLUMINATION XYZ MANIPULA Location : AMERICA North (USA-Canada-Mexico)
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More detailsMarantz AOI System Vintage: 2007 Year(s) : 2007 Location : EUROPE (Western and Northern)
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More detailsMANUAL PROBE STATION PROBE UP TO 5″ WAFERS, FAST CHESSMAN MOVEMENT FOR LARGE GEOMETRIES AND JOYSTICK FOR FINE Location : AMERICA North (USA-Canada-Mexico)
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More detailsULTRACISION 860 200mm XY TRAVEL WITH 8″ DIAMETER CHUCK WITH B&L ZOOM 5 STEREO OPTICS (8-40X) OR 16-80X WITH 2 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Model 455043-0000 Magnification 10 X Field Number 23 mm Trinocular/P Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield Illumination Type Reflected Light Binocular Angle 45° Eyepieces Mo Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield & DIC Illumination Type Xe Reflected Light Eyepieces Model KPL-W Location : AMERICA North (USA-Canada-Mexico)
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More detailsProber Version: 300 mm Vintage: 01.05.2006 De-installed, warehoused. Inspection WITH POWER-UP DEMONSTRATION i Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWAFER FILM THICKNESS MEASUREMENT SYSTEM Vintage: 01.06.1991 KLA-Tencor Prometrix Film Thickness Probe W/ FT-65 Year(s) : 1991 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield Illumination Type Reflected Light Binocular Angle 45° Eyepieces Mo Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Type Microzoom Multiple Objectives Models Bausch and Lomb 2.25 X 0.04 N.A. 8 X 0.15 N.A. 25 X 0.3 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAnti Static Probes YES Heated Nitrogen YES Rotors Included YES Controller Type Microprocessor Controller T Location : AMERICA North (USA-Canada-Mexico)
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More detailsSubstrate Size Up to 125mm Wafer Size Range Maximum 125 mm Controller Type Microprocessor Controller Ty Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 60° Eyepieces Magnification 10 X Field Number 22 mm Magnification Range 10 X - 40 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMeasurement Display Range … 200 A to 655,000 A (20nm to 65,000nm) Vertical Resolution … 5A (.5nm) Scan Length Location : AMERICA North (USA-Canada-Mexico)
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More detailsExterior Dimensions Width 47.244 in (120.0 cm) Depth 58.268 in (148.0 cm) Height 66.929 in (1 Year(s) : 2015 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.