Used Metrology and inspection equipment
1,259 resultsMicroscope Location : EUROPE (Western and Northern)
Price : On request
More details5 kW-Maschine. A modification up to 8 kW is possible (with new Software and guarantee). Upper drawer in order, Year(s) : 2002 Location : EUROPE (Western and Northern)
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More detailsRepair Station, Type Veri Smart VRL-OL Year(s) : 2006 Location : EUROPE (Western and Northern)
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More details3 X 400 V~ / 50 Hz B (width) m / T (depth) m H (height) m / G (weight) t ja (yes) wird geprueft (gets chec Location : EUROPE (Western and Northern)
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More detailsStaub 6 kW Device with additional Glass pane so that the Film not by warming warps including various new spar Location : EUROPE (Western and Northern)
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More detailsVintage: 12/2018 Benchtop 3D Automated Optical Inspection System Direct Loading Max PCB Size: 520mm Orca Chas Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More details150mm Manual Analytical Wafer Prober. Vacuum Chuck: 6” dia. (150mm). Manual XY stage movement: 6” X x 6” Y. P Location : AMERICA North (USA-Canada-Mexico)
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More detailsManual Analytical Wafer Probe Station. Wafer prober designed to support a broad range of precision probing ap Location : AMERICA North (USA-Canada-Mexico)
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More detailsView Pinnacle 250 Video Measuring Tool. The Pinnacle features a damped granite base and column, with passive Location : AMERICA North (USA-Canada-Mexico)
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More detailsS-1160MW-D6 Manual 6" Analytical Wafer Prober. Manual Probe System designed for reliable and accurate analytic Location : AMERICA North (USA-Canada-Mexico)
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More detailsWyko NT9800 Noncontact Profiler Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 8" Tool's Condition Refurbishing Step height: Nanometers to 1000µ;m Step height repeatability : 4 Year(s) : 2017 Location : ASIA (North East)
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More detailsWafer Size 8" Vintage 2012-3 Tool's Condition Refurbishing The KLA-Tencor P-16+ Profiler is a highly sensiti Year(s) : 2012 Location : ASIA (North East)
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More detailsModel Dimension 7000 Wafer Size 8" Vintage 1996-3 Year(s) : 1996 Location : ASIA (North East)
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More detailsWafer Size 8" Tool's Condition Refurbishing 1.Microscope : - Model : OLYMPUS MX61L F - Objectives :5X,10X,20 Location : ASIA (North East)
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More detailsWafer Size 8" Vintage 2018-4 Tool's Condition Refurbishing ■ System Configuration . WT2020 main unit with sc Year(s) : 2018 Location : ASIA (North East)
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More detailsWafer Size 8" Vintage 2009-5 Tool's Condition Excellent ■ System Configuration . WT2000PV main unit with scan Year(s) : 2009 Location : ASIA (North East)
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More detailsWafer Size 8" . Up to 8" . Automatic robotic wafer handling . Single open-cassette wafer loading station . Me Year(s) : 0 Location : ASIA (North East)
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More detailsWafer Size 8" Vintage 2000-10 . Wafer size : 200mm . CE marked . Single open cssette handler . Image Computer Year(s) : 2000 Location : ASIA (North East)
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More detailsWafer Size: 200mm 150/200mm Open Handler Software Version 5.3.17.4 Double Darkfield Inspection Tool SECS II Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
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More detailsManual wafer load profilometer Max wafer size: 8"/200mm Computer controlled Measures roughness, waviness, step Location : AMERICA North (USA-Canada-Mexico)
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More details- Automated Surface Profilometer - Wafer Size: 8"/200mm - Automated Wafer Handler - 1 Open Loader for 200mm - Location : AMERICA North (USA-Canada-Mexico)
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More detailsDetails - Anly H8DA Counter/Timer - Omron H7ET Lamp Operator Location : AMERICA North (USA-Canada-Mexico)
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More details- CTI Cryogenics 9600 Compressor - Set Up for 6" Wafers - Computer - Keyboard & Mouse Location : AMERICA North (USA-Canada-Mexico)
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More details- Cybor Model 512 Power Supply - Cybor Control Module - Thermo Scientific A25 Chiller - SN: 0307 - Develope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.