Used Metrology and inspection equipment
1,299 resultsP-5000W Description W-PLug Year(s) : 1999 Location : ASIA (North East)
Price : On request
More detailsWafer Size 300mm Year(s) : 2004 Location : ASIA (North East)
Price : On request
More detailsCVP-320 Year(s) : 2008 Location : ASIA (North East)
Price : On request
More details5100 Location : ASIA (North East)
Price : On request
More detailsWET Station size 12" Year(s) : 2007 Location : ASIA (North East)
Price : On request
More detailsDark Field Inspection size 8" Year(s) : 2003 Location : ASIA (North East)
Price : On request
More detailsDimension 3100 AFM X-Y imaging area approx. 90um square Z range approx. 6um up to 150mm sample size nanoscope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMitutoyo microscope 1064nm pulsed YAG laser Alessi 4100 manual prober with 150mm vacuum chuck Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details100mm wafer vacuum chuck B&L 7 stereozoom with coax illumination 2 R&K micropositioners Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsElec: Probe card inspection Location : ASIA (North East)
Price : On request
More details5150 Description Elec: Probe card inspection Location : ASIA (North East)
Price : On request
More details5200 Description Elec: Probe card inspection Location : ASIA (North East)
Price : On request
More detailsDMP-3000 fluid deposition printer with 300mm x 300mm print area and positional accuracy of 5um Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInspect-X Software X.Tract – Create 3D X-Ray Model 2D X-Ray 160kV Open Tube X-Ray Automated Inspection 20W (be Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFive Camera In-Line AOI System 10 MP cameras with ISIS Vision 13.4 micron um/pixel TELECENTRIC COMPOUND lenses Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSmall Footprint Min/Max Board Size: 2 x 2.4 to 10 x 13 in PCB Clearance: Top: 40 mm, 1.57 in., Bottom: 40 mm, Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSingle side inspection, 18 micro meter resolution Can be reconfigured for conformal coating inspection. Board Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVery Low Use! 3D Solder Paste Inspection System 100% 3D Paste Measurement based on the patented Shadow-Free me Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMaintenance free Tube Sealed reflection target 130 Kv 5 micron spot size 39-watt max. output CAD Input: Pick a Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsPost Reflow, Post Paste and Post Wave High Resolution Telecentric optics 75 Megapixels per second 5 MP Color C Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsLaser particle counter Year(s) : 1989 Location : ASIA (North East)
Price : On request
More detailsUMA-802-HC551NY Description UV cure Year(s) : 1995 Location : ASIA (North East)
Price : On request
More detailsSCW-622-B Description SOG coater Year(s) : 1991 Location : ASIA (North East)
Price : On request
More detailsResist stripping system （organic solvent） Year(s) : 1984 Location : ASIA (North East)
Price : On request
More details3030VAL SPI Vintage: 11/2007 3D Vision SMEMA conveyor with Bottom Up Side Edge Clamping Measures: Volume, Heig Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.