Used Metrology and inspection equipment
1,307 resultsVery Low Use! 3D Solder Paste Inspection System 100% 3D Paste Measurement based on the patented Shadow-Free me Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMaintenance free Tube Sealed reflection target 130 Kv 5 micron spot size 39-watt max. output CAD Input: Pick a Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsPost Reflow, Post Paste and Post Wave High Resolution Telecentric optics 75 Megapixels per second 5 MP Color C Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsLaser particle counter Year(s) : 1989 Location : ASIA (North East)
Price : On request
More detailsUMA-802-HC551NY Description UV cure Year(s) : 1995 Location : ASIA (North East)
Price : On request
More detailsSCW-622-B Description SOG coater Year(s) : 1991 Location : ASIA (North East)
Price : On request
More detailsResist stripping system （organic solvent） Year(s) : 1984 Location : ASIA (North East)
Price : On request
More details3030VAL SPI Vintage: 11/2007 3D Vision SMEMA conveyor with Bottom Up Side Edge Clamping Measures: Volume, Heig Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details160kV Open Tube (Filaments) Nano Focus X-Ray Tube 1200X Geometric Magnification Imaging System: Quality Assist Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThree Layer Programmable LED Light Source Min PCB: 2”x 2” Max PCB: 26"x 24" Pre And Post Reflow Inspection Cap Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsRepair Station, Type Veri Smart VRL-OL Year(s) : 2006 Location : EUROPE (Western and Northern)
Price : On request
More detailsE 2000 HT 300-4 Description: Diffusion Furnace Version: Solar Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomatic Optical Inspection CE Marked YES Condition Good Year(s) : 2011 Location : EUROPE (Western and Northern)
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More detailsBrightfield inspection Location : United States (USA)
Price : On request
More details60A Spin/Expose/Develop Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details80 B Coat/Track 56700-3354 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer ID Reader Optical Inspect Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDetails: Windows XP Operating System Software Rls: 1.49 Dual Table Fiducial Camera with Fiduci Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCondition: Complete & Operational Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDetails: 5 Cameras Bar Code NG Marking 4.2.0 Software 2048 x 2048 Resolution Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsOther: Frequency Sorter Location : ASIA (North East)
Price : On request
More details3 X 400 V~ / 50 Hz B (width) m / T (depth) m H (height) m / G (weight) t ja (yes) wird geprueft (gets chec Location : EUROPE (Western and Northern)
Price : On request
More detailsStaub 6 kW Device with additional Glass pane so that the Film not by warming warps including various new spar Location : EUROPE (Western and Northern)
Price : On request
More detailsConfiguration: KLA-Tencor 8100 CD-SEM is an advanced metrology instrument with capability to provide superior Year(s) : 1998 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFiber Laser Version: Solar Dimensions (WxHxD): 60x112x80 + 135x182x220 Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.