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Used Metrology and inspection equipment

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3 X 400 V~ / 50 Hz B (width) m / T (depth) m H (height) m / G (weight) t ja (yes) wird geprueft (gets chec Location : EUROPE (Western and Northern)

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Staub 6 kW Device with additional Glass pane so that the Film not by warming warps including various new spar Location : EUROPE (Western and Northern)

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Configuration: KLA-Tencor 8100 CD-SEM is an advanced metrology instrument with capability to provide superior Year(s) : 1998 Location : AMERICA North (USA-Canada-Mexico)

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Fiber Laser Version: Solar Dimensions (WxHxD): 60x112x80 + 135x182x220 Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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Max PCB: 382 mm x 300 mm HRSoft – suitable for Windows 8 Flexible Board Holder Top heater data: 70 x 70 mm, 90 Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Lead Free Capable Site cleaning feature 9 micron placement accuracy (0.0003”) @ 3 Sigma High volume rework Ult Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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Full 3D inspection 19.5x19.5” (500x500mm) max board size capability CMOS camera 16 μm per pixel resolution (sc Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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Three Heating Zones Cooling Zone Auto Profiling Semi-Automation Process Vision Alignment Max Board 20" x 23.5" Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

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150mm wafer chuck probe card holder joystick controller XY linear motor drive for chuck manual XY microscope t Location : AMERICA North (USA-Canada-Mexico)

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Wyko Veeco NT 8000Â 8 x 8 stage with Galil 5 axis stage controller Nixsystem G5 computer , running windows 7Â Location : AMERICA North (USA-Canada-Mexico)

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International 200mm hot chuck with digital controller Location : AMERICA North (USA-Canada-Mexico)

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Operating Temperature: 70 K to 730 K Temperature Stability: ± 0.1 K with MMR's Programmable Controller Temper Location : AMERICA North (USA-Canada-Mexico)

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Bulk resistivity of a slice with a known thickness Thickness in, A, MILS, or microns of a slice or layer with Location : AMERICA North (USA-Canada-Mexico)

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6x6 square chuck 12.5 micron stylus VLSI Step Height Calibration standard - 4.438um camera motorized 6x6 XY st Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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*. Fully refurbished. *. Installed in Clean-room. *. Can demonstrate any time. Wafer Size 8" Location : ASIA (North East)

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-CE MARKED -INCLUDES ALL SOFTWARE DISKS AND ELECTRONIC MANUALS -ONLY USED FOR RUNNING A FEW PILOT LOTS -NEVER Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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SDI ID: 99830 Manufacturer: JORDAN VALLEY Model: JVX6200I Type: X-ray Metrology System Version: 300 mm Conditi Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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PCB Size supported: From L50mm x W 50mm to L460mm x W360mm Inspection time: 0.2sec / inspection area Year(s) : 2006 Location : ASIA (South East)

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HITACHI S4160 for Sale Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)

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DT-MSM-1030A Description Manual Tape Mounter Location : ASIA (North East)

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NanoSpec AFT400 Wafer Size 8 Year(s) : 1997 Location : ASIA (North East)

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Detail (4) ZN50R-10-P7 Probe Tip (6) K-085-K-13 Probe Cable (6) GSG-100-40A-551-D Microwave Probes (1) P Location : AMERICA North (USA-Canada-Mexico)

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6"/150mm vacuum chuck Leica S6E trinocular stereozoom, 10x/23 eyepieces, 6.3-40x zoom, total magnification 6 Location : AMERICA North (USA-Canada-Mexico)

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Vacuum base Probe arm 100TPI lead screws Priced per positioner Location : AMERICA North (USA-Canada-Mexico)

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PH150 micropositioner with vacuum hold-down - Condition Refurbished Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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