Used Metrology and inspection equipment
1,163 resultsInstruments 49197701 2.6 Mil Camera Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: N1 N 1 Checker FAI First Article Inspection Line Downtime = Lost Revenue n=1 makes FAI quick and f... Location : AMERICA North (USA-Canada-Mexico)
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More detailsUSHIO MP7150 LTCC / GREEN TAPE PUNCH P Location : AMERICA North (USA-Canada-Mexico)
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More detailsBausch & Lomb Zoom 4 Microscope on stand with Nicholas Illuminator Location : AMERICA North (USA-Canada-Mexico)
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More detailsZeiss Trinocular Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsYTV-FX Condition: Complete & Operational Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsHorizon 03iX Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More detailsHorizon 02iX Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More details- Operating modes: Automatic, semi automatic, manual. - Stage theta rotation: 360 degrees. - Stage diameter -... Location : AMERICA North (USA-Canada-Mexico)
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More details- Spray Acid Tool (SAT) - Single Chamber - Up to 6"/150mm capable - Capacity: Single 25-Wafer Cassette, 150mm... Location : AMERICA North (USA-Canada-Mexico)
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More detailsDetails: Calibrated Dec. 2019 Windows XP Operating System Condition: Complete & Operational Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDetails: 120VAC – 1500W Max Condition: Complete & Operational Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
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More details- Manual Mask Aligner - Topside Alignment (TSA) - Manual Alignment - Up to 6"/150mm Wafer Capable (with proper... Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDual Band Visible IR Heating System 150W Lens Focused with adjustable image system Supplied with 2 lenses Comp... Year(s) : 2012 Location : EUROPE (Western and Northern)
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More detailsDetails: Windows XP Operating System S/W Version 2.3.31 Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDetails: Windows XP Software Version: 8.5 Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsVoltage: 115 Single lane Operating System Windows 2000 Vision 2007 Ver 4.8 program Manual - soft copy on machi... Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More details- Manual Mask Aligner - Topside Alignment (TSA) - Automatic Alignment - Up to 6"/150mm Wafer Capable (with pro... Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More details- Long Scan Surface Profilometer - Wafer Size: 8"/200mm - S/N: 1090-0420 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMax Wafer: 200mm - Temperature Compenstation Configuration (RS55/TC) - Up to 8"/200mm Wafers - Manual Wafer H... Location : AMERICA North (USA-Canada-Mexico)
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More detailsMax Wafer: 200mm - Image resolution is 4 nm. - Maimum current density of 30 A/cm2 or greater - Common applic... Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMax Wafer: 200mm System Dimensions: Main Unit 18×26 1/2×13 1/2 Wafer Handler 18x31x18 Weight: 678 lbs - Aut... Location : AMERICA North (USA-Canada-Mexico)
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More detailsFeatures: EA-H15 Infrared reflow soldering section of BGA rework system Infrared temperature sensor monitors... Location : EUROPE (Western and Northern)
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More detailsFeatures No need of nozzles, no airflow during re-flow process. 2. Use non-contact infrared temperature sensor... Location : EUROPE (Western and Northern)
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More detailsFeatures 1. High automatization, the de-soldering, pick-up and placement of chips can be finished by one butto... Location : EUROPE (Western and Northern)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.