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Used Metrology and inspection equipment

1,299 results
1

Ergolux Microscope Location : AMERICA North (USA-Canada-Mexico)

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UM-2 operates with transmission and reflection modes as well as bright field and dark field modules. System co Location : AMERICA North (USA-Canada-Mexico)

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Stage module A(R) with 5 dovetail slide rails. Objective module with sextuple revolving nosepiece (LD-Plan Location : AMERICA North (USA-Canada-Mexico)

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ST Surface Profiler Location : AMERICA North (USA-Canada-Mexico)

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NanoSpec AFT 200 Thickness Measurement System Location : AMERICA North (USA-Canada-Mexico)

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MA25 mask aligner configured for simultaneous double side exposure and manual operation of wafers with a maxim Location : AMERICA North (USA-Canada-Mexico)

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MA 56 is a mask alignment and exposure system which offers unsurpassed, highly economical mass production capa Location : AMERICA North (USA-Canada-Mexico)

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MICRASCAN MPT 193nm Scanner SVG DUV (193nm) stepper configured for processing 200mm wafers and linked to TEL A Location : AMERICA North (USA-Canada-Mexico)

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<b>1x KLA TENCOR, SM300, PROMETRIX Description</b> Film Thickness Spectramap Location : AMERICA North (USA-Canada-Mexico)

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Excellent and very clean condition. Equipment details: Haxagon Camera 8 pices 2.2 D Inspection Double Convey Year(s) : 2003 Location : EUROPE (Western and Northern)

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basic board inspection blue vacuum-underscreen-cleaner 400 mm ASM-adjustable screen mount squeegee head with Year(s) : 2003 Location : EUROPE (Western and Northern)

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Semitool STI 260C rinser dryer, now with 3" rotor, w/o controller Location : AMERICA North (USA-Canada-Mexico)

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Brand: Argus Argus 73 infrared heater, 2 kw, 18 mm spot, 31 mm focus distance,controller & stand , 120V Location : AMERICA North (USA-Canada-Mexico)

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Met One 200-1-115-1 clean room monitor. Counts 6 channels simultaneously, .3, .5, 1, 2, 5 & 10 micron. RS232 i Location : AMERICA North (USA-Canada-Mexico)

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Austin American Technology SS610 SMT hot gas reflow rework station, 7.5" x 7.5" movement. 115 volts Location : AMERICA North (USA-Canada-Mexico)

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JUTZE 3D Inline PCB Thickness: 0.6mm - 6.0mm PCB Measurements: 50mm x 70mm - 510mm x 460mm Weight: 777Kg Mach Location : EUROPE (Western and Northern)

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Fixed Rail: Front OEM: Viscom Transfer Direction: Left to Right Year(s) : 2000 Location : EUROPE (Western and Northern)

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RMS Systems/Hologenix NGS 3500 Defect Detection System Automatic Defect Detection & Classification Automated Location : AMERICA North (USA-Canada-Mexico)

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Suss/MFI Vibsense For use with Suss MFI Probehead or for the monitoring of environmental parameters of any pi Location : AMERICA North (USA-Canada-Mexico)

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Veeco CPII Atomic Force Microscope Motorized Z stage, scans up to 100um, Mitutoyo M Plan Apo 20SL objective w Location : AMERICA North (USA-Canada-Mexico)

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Veeco/Digital Instruments Nanoscope III SPM Atomic Force Microscope Nanoscope III SPM and controller, LSSF la Location : AMERICA North (USA-Canada-Mexico)

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micropositioner with vacuum base 12C Picoprobe with power supply Location : AMERICA North (USA-Canada-Mexico)

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Meas. technique: non-contact, junction photovoltage (JPV) Sample size: 100 to 156 mm (210mm option) Sa Location : AMERICA North (USA-Canada-Mexico)

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PH150 micropositioner with vacuum hold-down - Condition Refurbished Location : AMERICA North (USA-Canada-Mexico)

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Operating Temperature: 70 K to 730 K Temperature Stability: ± 0.1 K with MMR's Programmable Controller Temper Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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