Used Metrology and inspection equipment
1,303 results- Up to 8"/200mm wafer capable - Computer controlled - Measures roughness, waviness, step height, and other su Location : AMERICA North (USA-Canada-Mexico)
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More detailsS139226 ESI Accuscribe 2600 Laser Wafer Scriber w/ Panasonic Loader Depth (in inches) 66 Width (in inches) 9 Location : AMERICA North (USA-Canada-Mexico)
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More detailsC113239 Veeco Dektak SXM Atomic Force Microscope, Equipe Robots, 8" Wafer Chuck Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x KLA TENCOR, Alphastep 200, PROMETRIX Description</b> Profilometer Condition/WarrantyAs-is, where-is Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b>1x KLA TENCOR, SM300, PROMETRIX Description</b> Film Thickness Spectramap Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x KLA TENCOR, RS35, PROMETRIX Description</b> Resistivity Measurement Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x Semix/Tazmo, TR6133UD, Inspection Equipment Description</b> Configuration 150mm - dual Indexers Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Semix/Tazmo <b>1x Semix/Tazmo, TR6132U, Inspection Description</b> Configuration 150mm Condition/Warr Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x Waferworx, 53-450000-001, Inspection Description</b> Configuration 200mm and has Olympus Mdl MX80-F Mic Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Veeco Model: 1001 ION MILL Specifications • Used • Description Ion Mill • Configuration 10" Ion Mill ( Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Leybold Model: U1100 Plus LEAK DETECTOR Specifications • Used • Description Leak Detector Location : AMERICA North (USA-Canada-Mexico)
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More detailsManufacturer KLA-Tencor Model 8100E Description: CD SEM Configuration: 8" setup Location : AMERICA North (USA-Canada-Mexico)
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More details<font face="arial"><small><b>MANUFACTURE: </b> Thermawave <b>MODEL/TYPE#: </b> OP2600 ▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬▬ < Location : AMERICA North (USA-Canada-Mexico)
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More detailsPre Reflow and Post Reflow High-Speed Camera, 12MP CMOS Camera Patented - Next Generation 3D Model Processing, Location : AMERICA North (USA-Canada-Mexico)
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More detailsAtis Co. Ltd. AU Etch Station looks to be in good cosmetic condition, showing some signs of wear. However, I Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: KLA Model: 1007-47 SEMI-AUTOMATIC WAFER PROBER SYSTEM Specifications - Used - Semi-Automatic Wafer Pro Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated Optical Inspection Year(s) : 2016 Location : -
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More detailsInstruments 49197701 2.6 Mil Camera Location : AMERICA North (USA-Canada-Mexico)
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More detailsFacilities: 110 VAC 1ph, 50/60Hz, 15amps / 80 psi, 2 CFM Dims: 59" x 66" x 63" @ 5,500 lbs offers complete ins Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More detailsZeiss Trinocular Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 8 Year(s) : 1997 Location : ASIA (North East)
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More detailsEquipped with a Die. The Pneumatic MARK V cuts and forms component leads to a variety of configurations at hig Location : AMERICA North (USA-Canada-Mexico)
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More details* EQP-00564 & EQP-00565 * Automatic wafer inspection system * 3", 4" and 5" 6" capacity * Computer control Oly Location : AMERICA North (USA-Canada-Mexico)
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More detailsup to 30 micron line/ space, inner & outer layers, including CRPT. Installation/ training included ( excl. tr Year(s) : 2010 Location : EUROPE (Western and Northern)
Price : On request
More detailsTISI ID 150901-24 Manufacturer KLA-Tencor Model 2132 Description Bright Field Inspection Wafer Size 200mm Location : ASIA (North East)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
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HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.