Used Metrology and inspection equipment
1,259 resultsXD7500VR 160 KVa Open Tube X-ray System Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsJEOL JSM 6700 Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsPre Reflow and Post Reflow High-Speed Camera, 12MP CMOS Camera Patented - Next Generation 3D Model Processing, Location : AMERICA North (USA-Canada-Mexico)
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More detailsInstruments 49197701 2.6 Mil Camera Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: N1 N 1 Checker FAI First Article Inspection Line Downtime = Lost Revenue n=1 makes FAI quick and fric Location : AMERICA North (USA-Canada-Mexico)
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More detailsB&L Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsInstalled in Clean-room. Wafer Size Other Location : ASIA (North East)
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More detailsWafer Size 8" Year(s) : 1997 Location : ASIA (North East)
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More detailsTo be refurbished Installed in Clean-room. Wafer Size 8" Year(s) : 1998 Location : ASIA (North East)
Price : On request
More detailsBrand: SEMILAB SDI/SEMILAB FAaST 200-SL Non contact CV/IV Measurement non-contact electrical C-V & I-V measu Location : ASIA (North East)
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More detailsSONIX Quantum 350 Scanning Acoustic Microscopy (SAM) Wafer Size 8" Scanning Acoustic Tomography (SAT), also c Year(s) : 2006 Location : ASIA (North East)
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More detailsMicro manupulator 6400F Manual Probe Station Wafer Size 8" - Micro manupulator Manual Probe Station 6400F - J Location : ASIA (North East)
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More detailsAMC 7700 EPI Reactor with Moore Uniformity Kit *. Process: Epilayer growth on silicon wafer *. Operational a Location : ASIA (North East)
Price : On request
More detailsBrand: LEO/KOBELCO LEO/KOBELCO LTA-700 Wafer Lifetime Mesurement System Wafer Size 6" Variiable Injection Ty Year(s) : 1997 Location : ASIA (North East)
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More detailsBrand: SEMILAB SDI/SEMILAB WT-2000 Basic units WT-2000 main unit with scanning capability Sample stage (max Year(s) : 2007 Location : ASIA (North East)
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More detailsSSM 5200 Automatic CV System for CV/QV/IV measurement Fully automated capacitance-voltage(CV),charge-voltage( Year(s) : 1997 Location : ASIA (North East)
Price : On request
More detailsHitachi SEM S-4160 Performance: Rresolution: 2.5 nm at 30kv Magnification: 20X - 300KX Electron Optics: Elec Location : ASIA (North East)
Price : On request
More detailsHitachi SEM S-5000 - 30KV 0.6nm - 1 KV 2.5nm with a test specimen *.Magnification 20X ~ 300,000X *. Stage Year(s) : 1996 Location : ASIA (North East)
Price : On request
More detailsN&K 5700 CDRT Metrology system Broadband spectrometry for film thickness and trench profile measurements on p Year(s) : 2006 Location : ASIA (North East)
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More detailsNIDEK IM-11 5" Wafer Autoloader - Nidek wafer auto loader. - 5" wafer. - Power: 120V, 5A - Utility: Vacuum. Location : ASIA (North East)
Price : On request
More detailsNIDEK 8" Wafer Autoloader IM-14 - 8" wafer. - Power: 120V, 5A - Utility: Vacuum. *. Fully refurbished. Fully Location : ASIA (North East)
Price : On request
More detailsNikon NWL641M Wafer Autoloader IC Inspection Wafer Loader Wafer Size : 4~6" Inspection mode : Micro & Tilt M Year(s) : 2001 Location : ASIA (North East)
Price : On request
More detailsAMC 7700 EPI Reactor Wafer Size 6" *. Process: Epilayer growth on silicon wafer *. Operational at the time o Location : ASIA (North East)
Price : On request
More detailsNikon Eclips L200 Microscope Wafer Size 8" Installed in Clean-room. *. Can demonstrate any time Location : ASIA (North East)
Price : On request
More detailsOlympus MX80-F Microscope (up to 300mm wafer) Wafer Size 12" * 200/300 mm wafer size * OBJECTIVES :5/10/20/50 Location : ASIA (North East)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.