Used Metrology and inspection equipment
1,259 resultsHTO PROCESS lP SIN TEOS PROCESS Year(s) : 1997 Location : ASIA (China - Taiwan - HKG)
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More detailsEXCALIBUR 2000 Location : ASIA (China - Taiwan - HKG)
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More detailsS5000 Location : ASIA (China - Taiwan - HKG)
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More detailsS-7800H Critical Dimension Scanning Electron Microscope (CD-SEM), 4″-8″ Automatic cassette to cassette wafer l Location : ASIA (China - Taiwan - HKG)
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More detailsS8820 Location : ASIA (China - Taiwan - HKG)
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More detailsS 5000 Location : ASIA (China - Taiwan - HKG)
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More detailsWAFER SIZE: 150MM Location : ASIA (China - Taiwan - HKG)
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More detailsNSR-4425i 6 inch As-is condition Complete with no missing parts Working condition before decommissioned Perfec Year(s) : 1995 Location : ASIA (China - Taiwan - HKG)
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More detailsAUTO MICROSCOPE WAFER SIZE: 150MM WITH LOADER Location : ASIA (China - Taiwan - HKG)
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More detailsS4500 Location : ASIA (China - Taiwan - HKG)
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More detailsOVERLAY INSECTION SYSTEM, 8” WITH PANELS FULLY AUTOMATED COHERENCE PROBE MICROSCOPY (CPM) TECHNOLOGY GRAINY TA Location : ASIA (China - Taiwan - HKG)
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More detailswafer size:150mm – Sample size: up to 200mm – Low force head: 0.05 – 15mg – 0.05mg resolution – Step heigh rep Location : ASIA (China - Taiwan - HKG)
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More detailscomplete with no missing parts Location : ASIA (China - Taiwan - HKG)
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More detailsFPA 5500iZa can power on Location : ASIA (China - Taiwan - HKG)
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More detailsCROSS SEXCTION SEM WORKING CONDITION Location : ASIA (China - Taiwan - HKG)
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More detailsmanual Topside Aligner 150mm as-is complete tool Location : ASIA (China - Taiwan - HKG)
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More details6100 refurbished available in warehouse Location : ASIA (China - Taiwan - HKG)
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More detailsSFS 7600 Wafer: 150/200 mm SN: 0194-343 Year(s) : 1994 Location : ASIA (China - Taiwan - HKG)
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More detailsFOR PATTERN WAFER AS-IS AND REFURBISHED WAFER SIZE: 1500/200MM Location : ASIA (China - Taiwan - HKG)
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More details<b>1x Semix/Tazmo, TR6133UD, Inspection Equipment Description</b> Configuration 150mm - dual Indexers Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x Waferworx, 53-450000-001, Inspection Description</b> Configuration 200mm and has Olympus Mdl MX80-F Mic Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x KLA TENCOR, Alphastep 200, PROMETRIX Description</b> Profilometer Condition/WarrantyAs-is, where-is Location : AMERICA North (USA-Canada-Mexico)
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More detailsWaferworx 3D Inspection 200mm and has Olympus Mdl MX80-F Microscope Location : AMERICA North (USA-Canada-Mexico)
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More details4-in-1 AOI Solution for Advanced PCB production Includes SLP, mSAP, advanced HDI, advanced Flex and IC substra Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDetails: Mechanical Pusher Pushes PCB’s from Magazine onto Conveyor of Next Machine Bottom Magazine Cl Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.