Used Metrology and inspection equipment
1,302 results3D Bump Height (Veeco) Version: 150 mm/200 mm Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTM-330 Version: 150 mm/200 mm Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrightfield Wafer Defect Inspection System Version: 200 mm Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTurboDISC mocvd SYSTEM Version: Inquire Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More detailsE 2000 HT 300-4 Description: Diffusion Furnace Version: Solar Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsFiber Laser Version: Solar Dimensions (WxHxD): 60x112x80 + 135x182x220 Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details-CE MARKED -INCLUDES ALL SOFTWARE DISKS AND ELECTRONIC MANUALS -ONLY USED FOR RUNNING A FEW PILOT LOTS -NEVER Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSDI ID: 99830 Manufacturer: JORDAN VALLEY Model: JVX6200I Type: X-ray Metrology System Version: 300 mm Conditi Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsHITACHI S4160 for Sale Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSpin Rinse Dryer Location : AMERICA North (USA-Canada-Mexico)
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More detailsFlexible AOI SMEMA : True Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 8" Tool's Condition Refurbished Measurement Range : 25§- 20탆 - 500?-200 um with the visible light Location : ASIA (North East)
Price : On request
More detailsWafer Size 8" Tool's Condition Refurbishing •; Optimized Polarized Reflectance (Rs and Rp) Data - Wavelength Location : ASIA (North East)
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More detailsDetails: Dimensions 28" x 53 1/4" x 53" Weight 288 lbs Electrical Requirements (North America): 120VAC, 10 Am Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVoltage: 115 Single lane Operating System Windows 2000 Vision 2007 Ver 4.8 program Manual - soft copy on machi Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsNanoscope III Scanning Probe Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpin RInser/Dryer Location : AMERICA North (USA-Canada-Mexico)
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More detailsmicroscope operates with bright field (BF), dark field (DF), and polarization modules. System includes eyepiec Location : AMERICA North (USA-Canada-Mexico)
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More detailsOverlay Metrology System Location : AMERICA North (USA-Canada-Mexico)
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More detailsErgolux Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsUM-2 operates with transmission and reflection modes as well as bright field and dark field modules. System co Location : AMERICA North (USA-Canada-Mexico)
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More detailsStage module A(R) with 5 dovetail slide rails. Objective module with sextuple revolving nosepiece (LD-Plan Location : AMERICA North (USA-Canada-Mexico)
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More detailsST Surface Profiler Location : AMERICA North (USA-Canada-Mexico)
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More detailsNanoSpec AFT 200 Thickness Measurement System Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMA25 mask aligner configured for simultaneous double side exposure and manual operation of wafers with a maxim Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.