Used Metrology and inspection equipment
1,259 resultsDetail (4) ZN50R-10-P7 Probe Tip (6) K-085-K-13 Probe Cable (6) GSG-100-40A-551-D Microwave Probes (1) P Location : AMERICA North (USA-Canada-Mexico)
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More details6x6 square chuck 12.5 micron stylus VLSI Step Height Calibration standard - 4.438um camera motorized 6x6 XY st Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBulk resistivity of a slice with a known thickness Thickness in, A, MILS, or microns of a slice or layer with Location : AMERICA North (USA-Canada-Mexico)
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More detailsOperating Temperature: 70 K to 730 K Temperature Stability: ± 0.1 K with MMR's Programmable Controller Temper Location : AMERICA North (USA-Canada-Mexico)
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More detailsInternational 200mm hot chuck with digital controller Location : AMERICA North (USA-Canada-Mexico)
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More detailsWyko Veeco NT 8000Â 8 x 8 stage with Galil 5 axis stage controller Nixsystem G5 computer , running windows 7Â Location : AMERICA North (USA-Canada-Mexico)
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More details150mm wafer chuck probe card holder joystick controller XY linear motor drive for chuck manual XY microscope t Location : AMERICA North (USA-Canada-Mexico)
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More detailsDMP-3000 fluid deposition printer with 300mm x 300mm print area and positional accuracy of 5um Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More details100mm wafer vacuum chuck B&L 7 stereozoom with coax illumination 2 R&K micropositioners Location : AMERICA North (USA-Canada-Mexico)
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More detailsMitutoyo microscope 1064nm pulsed YAG laser Alessi 4100 manual prober with 150mm vacuum chuck Location : AMERICA North (USA-Canada-Mexico)
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More detailsDimension 3100 AFM X-Y imaging area approx. 90um square Z range approx. 6um up to 150mm sample size nanoscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsMaximum 6" wafers Includes rotor for 6"x6" substrates Static eliminators Resistivity monitor PSC-101 controlle Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsspin dryer with 150mm wafer carrier Location : AMERICA North (USA-Canada-Mexico)
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More detailsmax 5" diameter substrate or 4"x4" square CT-60 controller max 5000 rpm with steps of 10 rpm substrate thickne Location : AMERICA North (USA-Canada-Mexico)
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More details6 axis translation stage: all axes are motorized Configuration from bottom to top: Large Goniometer: Roll Sing Location : AMERICA North (USA-Canada-Mexico)
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More detailsFS60 microscope with 2/5/10/20 objectives Location : AMERICA North (USA-Canada-Mexico)
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More detailsultra high resolution remote control XY travel range 10mm Z range 8mm 0.2 micron resolution Location : AMERICA North (USA-Canada-Mexico)
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More detailsset of 4 programmable positioners, north, south, east, west includes cables and interface boards for PA200 pro Location : AMERICA North (USA-Canada-Mexico)
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More detailsmanual 6" prober with B&L Microzoom 2 Fiber optic light source and adaptor 5" vacuum chuck Location : AMERICA North (USA-Canada-Mexico)
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More detailsSCA-50 software package ver. 1.21 Build 74 WT200E motorized measuring stage adjustable in 3 axes. Lens mount w Location : AMERICA North (USA-Canada-Mexico)
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More detailsSemiautomatic prober with 4" wafer chuck Mitutoyo FS-50 microscope with lamphouse motorized microscope xy with Location : AMERICA North (USA-Canada-Mexico)
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More detailsSemiautomatic prober with 150mm (6â€) nickel plated vacuum chuck. B&L Microzoom II microscope with 2.5, 8x, 2 Location : AMERICA North (USA-Canada-Mexico)
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More detailsFACTS 2 Acoustic Scanning Microscope, model DF2200, 110v Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription: Delta 80+ photoresist coater Gyrset closed cover coating technology Wafer size up to 200mm 2 Waf Location : AMERICA North (USA-Canada-Mexico)
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More detailsLoc8 Light, S/N 18310012 without Software Location : EUROPE (Western and Northern)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.