Used Metrology and inspection equipment
1,313 resultsMPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame ( Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAFM WORKSHOP MS 3220 ATOMIOC FORCE MICROSCOPE GOOD WORKING CONDITION Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details• Focusing Controls: Coarse / Fine • Nosepiece: Motorized 5-position rotatable • Eyepieces: WH10x-H/22 • Objec Location : ASIA (North East)
Price : On request
More detailsNanometrics ECVPro Carrier Concentration Profiler For Si, SiC, II-VI, III-V & III-Nitrides Hamamatsu LC8 UV L Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThe machine is in perfect working condition, Location : EUROPE (Western and Northern)
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More detailsThermo Oriel Accudose 9000 Photospeed Tool. Measures batch to batch photospeed variations. Photoresist testi Location : AMERICA North (USA-Canada-Mexico)
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More detailsMirtec AOI Automatic Optical Inspection Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
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More detailsCascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. C Location : AMERICA North (USA-Canada-Mexico)
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More details• Particle Size Range: 0.5 to 10 microns • Manifold: AM-12-1.0 aerosol manifold • Pump: AM-12 pump included • Location : AMERICA North (USA-Canada-Mexico)
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More detailsTESCAN VEGA-II Model LSH SEM. Computer Controlled Scanning Electron Microscope, high vacuum operation, 230mm Location : AMERICA North (USA-Canada-Mexico)
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More details• Resolution: 3 nm at 30 kV • Magnification: Up to 300,000× • Stage: 5-axis motorized • Sample Size: Supports Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsUsed <b> Manufacture : Rudolph Model : EL III Date Manufactured : 09/89 Ellipsometer </b> Details: Wafer Size Year(s) : 1989 Location : AMERICA North (USA-Canada-Mexico)
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More detailsUsed <b> Manufacture : SemiTool Model : WST406MG Manufacture YR. : Dec. 2000 Desc : Solvent Processor </b> De Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpec : -Semitool graphic controller display screens -chemical cabinet (2 tanks, 1 for redian PRS1000, 1 for f Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsX-Y Recorder S/N 221059 For Implant Tool Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsHandy Communication Terminal,DC24V/12W Furnace Remote Control Pad Location : AMERICA North (USA-Canada-Mexico)
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More detailsFurnace, poly Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: N1 N 1 Checker FAI First Article Inspection Line Downtime = Lost Revenue n=1 makes FAI quick and fric Location : AMERICA North (USA-Canada-Mexico)
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More detailsInstruments 49197701 2.6 Mil Camera Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsPre Reflow and Post Reflow High-Speed Camera, 12MP CMOS Camera Patented - Next Generation 3D Model Processing, Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: SILLNER SILLNER Lasermark 940 Location : EUROPE (Western and Northern)
Price : On request
More detailsSpecification: Display head: Trinocular 25x Ocular: Wild 10X/21 Diopric correction: +5 až -5 Approach: APO Zoo Location : EUROPE (Western and Northern)
Price : On request
More detailsSpecification: Illumination type: second light Binocular angle: 45° Ocular model: WHK 10x / 20L Magnification Location : EUROPE (Western and Northern)
Price : On request
More detailsNordson YESTECH YTV-FX in excellent condition. vintage 2011 Specifications: Throughput: Up to 10 sq. in./sec. Year(s) : 2011 Location : EUROPE (Western and Northern)
Price : On request
More detailsSpea 3030IL dual bay in excellent condition. Vintage 2006 The 3030IL is the fully automatic bed-of-nails test Year(s) : 2006 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.