Used Metrology and inspection equipment
1,045 resultsFeatures: Non-contact Accurate Digital display Temperature compensation High or Low Resist Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFeatures: Non-contact Accurate Digital display Wide operating range ASTM standard Thic Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription: 300/200mm wafers Dual Dark Field Collection Channels 0.079um Defect Sensitivity 0.001 ppm Haze Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpecifications: Stylus:12.5 um radius (Diamond) Scan Range: x:50 um - 50mm; z: 100 A - 131 um z R Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpecifications: Load locked single wafer sputter, cassette to cassette vertically mounted for sideways spu Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription: Magnetron sputtering system configured for 4" wafers, System is fully automated, cassette-to-cass Location : AMERICA North (USA-Canada-Mexico)
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More detailsFilm thickness measurement systems. Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpecifications: • For Etching and lithography process control • Highly stable scanning micro densitometer desi Location : AMERICA North (USA-Canada-Mexico)
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More detailsSurfscan Specifications: 4", 6" and 8" compatible Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, KLA-Tencor P-2 Long Scan Profilometer</b> High sensitivity, long scan surface profiler measuring rough Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, KLA-Tencor 2131 Defect Inspection System</b> The KLA-Tencor 2132 is a wafer defect inspection system. Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, KLA-Tencor, FLX-2300 FleXus </b> Thin-film stress measurement instrument that measures the changes in Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel: RTE 140 Refrigerated Bath / Circulator Used Details: Digital Controller Temperature range -40c to =150 Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, A double darkfield patterned wafer inspection tool. Features: Automated wafer inspection system Doubl Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, KLA-Tencor FleXus FLX 2320</b> Thin-film stress measurement instrument that measures the changes in t Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, KLA-Tencor 6100 Surfscan Analysis System</b> Unpatterned wafer surface contamination analyzer Feature Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, Veeco Dektak 3ST Surface Profiler</b> Surface profile measuring system. Specifications: Step Height M Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, KLA-Tencor, 5500 Surface Particle Inspection Analyzer</b> Features: Handles high scattering surfaces s Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel: RTE 221 Refrigerated Bath/Circulator Used Details: Analog control Temp. Range: -23 to +100 deg C Bath Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, KLA-Tencor AIT I In-Line Defect Inspection System</b> Automated full water inspection system for dete Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, KLA-Tencor Surfscan 7600 Particle Inspection System</b> A particle inspection tool - capable of up to Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, Dektak, IIA (Sloan) Surface Profile Measuring System</b> Surface Profile Measuring System, Capability Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b>1x, KLA-Tencor, CRS1010 UltraPointe Defect Review Station</b> Specifications: 200mm / 8inch capabilities. Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b>1x, KLA-Tencor P-10 Surface Profiler</b> A computerized, highly sensitive surface profiler that measures r Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsModel: Plasma-Therm Dual Chamber PECVD & RIE System Used Details: The 790 platform offered in both RIE and P Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.