Used Metrology and inspection equipment
1,149 resultsLEITZ ERGULUX Inspection Microscope with CD2 line width measuring system - X/Y Stages with 156mm travel -... Location : EUROPE (Central and Eastern)
Price : On request
More details* Cassette to Cassette Wafer handling for up to 200mm Wafers * LEICA ERGOPLAN Microscope with motorized X/Y 2... Location : EUROPE (Central and Eastern)
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More detailsOPERATING WAVELENGTH: 405nm,546nm,633nm (BW=± 5nm) RESOLUTION & ACCURACY at 633nm: Polarizer or Analyzer 0.... Location : EUROPE (Central and Eastern)
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More details* Automatic highly precise measurements of film thickness and refractive index. * Tilt-free, focus free, hand... Location : EUROPE (Central and Eastern)
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More details- X/Y Stages with 156mm travel - Wafersize from 3" to 6" - Motorized objective nosepiece. - Forwardly-place... Location : EUROPE (Central and Eastern)
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More details- Speed: 5 sec/cm² Sensitivity: 0.62 - Speed: 15 sec/cm² Sensitivity: 0.39 - Speed: 30 sec/cm² Sensitivity:... Location : EUROPE (Central and Eastern)
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More detailsDefects (scar, dirt, etc.) discovered under macro illumination can be registered by means of a switch, and the... Location : EUROPE (Western and Northern)
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More detailsOther V 48.0 A 50/60 Hz Exterior Dimensions Width 169.528 in (430.6 cm) Depth 61.890 in (1... Year(s) : 2012 Location : EUROPE (Western and Northern)
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More details-LINEAR-Drive for X- und Y-axis, -LINEAR Drive for Z-axis, -1 air-beared Westwind spindle WW 1790-12 (RPM30.00... Year(s) : 2014 Location : EUROPE (Western and Northern)
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More detailsHigh Speed XRay System f. Tray Handling Accessories input Feeder output feeder Power Requirements Other V... Year(s) : 2015 Location : EUROPE (Western and Northern)
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More detailsCR Technology RTI 7500 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAgilent SJ50 Post Reflow AOI 2002 Upgraded to series 1 Off-line programming workstation/server Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x CyberOptics, 8011843, SPI Inspection Description</b> Dimensions (h x w x d) 200 x 98 x 125 Weight 8... Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x CyberOpticsSE-200, 8002351, Inspection Equipment Description</b> Dimensions (h x w x d) 77.5 x 25.5... Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x Veeco, 4 point, probe Description</b> 3" system Location : EUROPE (Western and Northern)
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More details<b>1x Wentworth, MP 1301, Manual Probe Description</b> 6" CHUCK GOLD PLATED CHESSMAN MANIPULATOR Bausch &... Location : EUROPE (Western and Northern)
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More details<b>1x Tencor, Alpha Step 100, surface measurment Description</b> Throat depth 2.54" allowing measurment on... Location : EUROPE (Western and Northern)
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More details<b>1x Tencor, Alpha Step 200, surface profile Description</b> good condition , fully working and tested. Location : EUROPE (Western and Northern)
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More details2013 Mirtec MV-3L Bench top AOI Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Koh Young Technology 2010 Koh Young KY8030 II SPI - 3D Inspection Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Koh Young Technology 2009 Kohyoung KY3010T Desktop SPI Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Koh Young Technology 2009 KOH Young Solder Paste Inspection System KE 8030 Location : AMERICA North (USA-Canada-Mexico)
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More details2009 Yestech YTV-B2 AOI Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Koh Young Technology 2013 Kohyoung KY8030 II-L SPI Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details2010 Mirtec MV-7xi with 4 side view camera Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.