Used Metrology and inspection equipment
1,258 resultsDetails: Windows XP Operating System Software Rls: 1.49 Dual Table Fiducial Camera with Fiduci Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCondition: Complete & Operational Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDetails: 5 Cameras Bar Code NG Marking 4.2.0 Software 2048 x 2048 Resolution Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
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More detailsTemptronics TP04390A THERMOSTREAM THERMAL INDUCING SYSTEM GRADE C; UNIT PASSED SELF DIAGNOSTICS. NO HDD. MISS Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details* EQP-00564 & EQP-00565 * Automatic wafer inspection system * 3", 4" and 5" 6" capacity * Computer control Oly Location : AMERICA North (USA-Canada-Mexico)
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More detailsViking VIS-100W Die Inspection Systems (VIS-100W Die Inspection System) * EQP-00564 & EQP-00565 * Automatic Location : AMERICA North (USA-Canada-Mexico)
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More detailsTencor Sigmascan Profilometer & printer (Sigmascan model 80-00110) Tencor Sigmascan. Film thickness and Surf Location : AMERICA North (USA-Canada-Mexico)
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More detailsTencor OmniMap NC-110 * Non-Contact Resistivity System. * Measures complex aluminum and tungsten multilayer Location : AMERICA North (USA-Canada-Mexico)
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More detailsQC Optics OPTIQUEST reticle inspection Location : AMERICA North (USA-Canada-Mexico)
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More detailsPrometrix FT-530e Thin Film Mapping System. Location : AMERICA North (USA-Canada-Mexico)
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More detailsOPAL 7830i CD-SEM Location : AMERICA North (USA-Canada-Mexico)
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More detailsWentworth 925 (925) 6" manual probe station. Location : AMERICA North (USA-Canada-Mexico)
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More detailsTSK UF200 Automatic Prober * Single Cassette loader * Real time wafer map display and print * Heat up Chuck Location : AMERICA North (USA-Canada-Mexico)
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More detailsTSK APM90A Automatic Wafer Probers Single cassette loader -Head stage Standard -Real time wafer map display Location : AMERICA North (USA-Canada-Mexico)
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More detailsTSK AMP88 (AMP88) Wafer prober Location : AMERICA North (USA-Canada-Mexico)
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More detailsTeledyne TAC PR-100 Prober (TAC PR-100) Location : AMERICA North (USA-Canada-Mexico)
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More detailsTEL P8 Wafer prober. Bottom loader, Hot chuck. System is located in Santa Clara, CA abd available for inspect Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDymatix 680E (680E) 6" manual probe station. Location : AMERICA North (USA-Canada-Mexico)
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More detailsCascade Microtech + Alessi Name: Semi-Auto Probe Station Model: REL 5500 Vintage: 1996.5 Condition: Excellen Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Signatone Signatone SYS-301 Customer must supply probe heads and a Keithley 2400 multimeter Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Signatone Signatone S-301-4 (Signatone S-301-4) Customer must supply probe heads and a Keithley Location : AMERICA North (USA-Canada-Mexico)
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More detailsR&K 300 Probe Stations (300) Location : AMERICA North (USA-Canada-Mexico)
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More detailsR&K 260 Probe Stations (260) 4" chuck with 4" X-Y travel. Bausch & Lomb Stereo Zoom Microscope. Steel ring f Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsPacific Western Prober III System (PWS Prober III System) Wafer Prober. Pacific Western Systems P3, ECN 679, Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: Micropositioners Micropositioners Vacuum Based Micropositioners for Signatone Probers. Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.