Used Metrology and inspection equipment
1,303 resultsZeiss Axiotron HSEB Microscope Wafer Size 8" *. Modified auto stage movement. *. Attached additional scope he Location : ASIA (North East)
Price : On request
More detailsTencor HRP220 Step Height Measurement Sytem Wafer Size 8" Measurement Capabilities for meeting the requiremen Year(s) : 2000 Location : ASIA (North East)
Price : On request
More detailsLeica INS3000 Defect Inspection System Wafer Size 8" Year(s) : 1999 Location : ASIA (North East)
Price : On request
More detailsLeica INS3300 Defect Inspection System Wafer Size 12" Currently stocked in cleanroom. Year(s) : 2003 Location : ASIA (North East)
Price : On request
More detailsRudolph/August AXI 930 Macro Inspection System Wafer Size 8" Macro Inspection System to detect wafer level an Location : ASIA (North East)
Price : On request
More detailsRudolph/August AXI-S Macro Inspection System Wafer Size 8" Macro Inspection System to detect wafer level and Location : ASIA (North East)
Price : On request
More detailsTencor FLX-2908 Thin Film Stress Measurement Wafer Size 8" Installed in Clean-room. Location : ASIA (North East)
Price : On request
More detailsKLA-Tencor's 2401 Automated Macro Defect Inspection System Wafer Size 8" - Replacing the manual bright light Year(s) : 2001 Location : ASIA (North East)
Price : On request
More detailsKLA-Tencor's 2401 Automated Macro Defect Inspection System Wafer Size 8" - Replacing the manual bright light Year(s) : 2000 Location : ASIA (North East)
Price : On request
More detailsBIO-RAD/Accent QS-408M FT-IR Wafer Size 8" *. BIO-RAD FTIR QS-408. *. BPSG,EPI. *. Installed in Clean-room. * Year(s) : 1996 Location : ASIA (North East)
Price : On request
More detailsN&K 1700 Trench Depth & Thin film thickness Measurement Wafer Size 8" * .Available 100,125,150,200 mm by chuc Location : ASIA (North East)
Price : On request
More detailsN&K 3000 Trench Depth & Thin film thickness Measurement Wafer Size 6" Non-destructive measurements of Trench Location : ASIA (North East)
Price : On request
More detailsN&K 3700 RT Metrology System Wafer Size 8" Vintage 2004 Broadband spectrometry for film thickness on transpar Year(s) : 2004 Location : ASIA (North East)
Price : On request
More detailsN&K 8000 Trench Depth & Thin film thickness Measurement Wafer Size 8" Vintage 2007 Fully Automated Thin Film Year(s) : 2007 Location : ASIA (North East)
Price : On request
More detailsNanometrics Nanospec 9300 Thin Film Thickness Measurement Wafer Size 12" Vintage 2002 Currently 12" configure Year(s) : 2002 Location : ASIA (North East)
Price : On request
More detailsTencor P-2 Step Height Measurement System - Wafer Size 8" - Long Scan Profiler Measurement. - Standard Head w Location : ASIA (North East)
Price : On request
More detailsTencor P-20(H) Step Height Measurement Sytem - Wafer Size 8" - Scan Length: 210mm. - Scan Speed : 1㎛ ~ 25 mm/ Location : ASIA (North East)
Price : On request
More detailsVeeco/Digital Instruments Nanoscope III SPM Atomic Force Microscope Nanoscope III SPM and controller, LSSF la Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVeeco CPII Atomic Force Microscope Motorized Z stage, scans up to 100um, Mitutoyo M Plan Apo 20SL objective w Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSuss/MFI Vibsense For use with Suss MFI Probehead or for the monitoring of environmental parameters of any pi Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsRMS Systems/Hologenix NGS 3500 Defect Detection System Automatic Defect Detection & Classification Automated Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYestech YTV-FX Inspection Equipment 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKoh Young 8030-2 Inspection Equipment 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMirtec MV-7Xi Inspection Equipment 2013 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCYBEROPTICS SE 300 ULTRA 3D Solder Paste Inspection - Inline inspection system after printer - Vintage 2008 Location : EUROPE (Central and Eastern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.