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Used Metrology and inspection equipment

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Vanguard automation platform including: - Clean room compatible stainless steel cabinetry - Dual SMIF I/O for Year(s) : 1999 Location : EUROPE (Western and Northern)

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Thin film measurement system, 6"-8" Computer: Intel Pentium III Operating system: Windows NT (2) Open cassette Location : AMERICA North (USA-Canada-Mexico)

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USHIO MP7150 LTCC / GREEN TAPE PUNCH P Location : AMERICA North (USA-Canada-Mexico)

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Spec : -Semitool graphic controller display screens -chemical cabinet (2 tanks, 1 for redian PRS1000, 1 for f Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)

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Laser marking Refurbished Used Equipment - Outside dimensions (LxWxH): 1000 x 1635 x 1555 mm - Weight: 450 Year(s) : 2009 Location : EUROPE (Western and Northern)

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Serial Number: 10513 Year(s) : 1992 Location : AMERICA North (USA-Canada-Mexico)

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Waferworx 3D Inspection 200mm and has Olympus Mdl MX80-F Microscope Location : AMERICA North (USA-Canada-Mexico)

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Defects (scar, dirt, etc.) discovered under macro illumination can be registered by means of a switch, and the Location : EUROPE (Western and Northern)

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Orbotech - Spiron 8800 avip Brand: Orbotech Type: Spiron 8800 avip Description: AOI, max. panel size: 686 x 71 Year(s) : 2004 Location : EUROPE (Western and Northern)

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Equipped with Magnum ion Column SFEG UHR SEM STEM capable! 5 axis stage with 100 x 100 mm XY Turbo vacuum 2 GI Location : AMERICA North (USA-Canada-Mexico)

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Is equipped with 200KV, W or LaB6, SuperTWIN lens Beautiful and high performer! It includes a single tilt hold Location : AMERICA North (USA-Canada-Mexico)

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Installed in Clean-room. Wafer Size Other Location : ASIA (North East)

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Wafer Size 8" Year(s) : 1997 Location : ASIA (North East)

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To be refurbished Installed in Clean-room. Wafer Size 8" Year(s) : 1998 Location : ASIA (North East)

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Brand: LEO/KOBELCO LEO/KOBELCO LTA-700 Wafer Lifetime Mesurement System Wafer Size 6" Variiable Injection Ty Year(s) : 1997 Location : ASIA (North East)

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Brand: SEMILAB SDI/SEMILAB FAaST 200-SL Non contact CV/IV Measurement non-contact electrical C-V & I-V measu Location : ASIA (North East)

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Brand: SEMILAB SDI/SEMILAB WT-2000 Basic units WT-2000 main unit with scanning capability Sample stage (max Year(s) : 2007 Location : ASIA (North East)

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SONIX Quantum 350 Scanning Acoustic Microscopy (SAM) Wafer Size 8" Scanning Acoustic Tomography (SAT), also c Year(s) : 2006 Location : ASIA (North East)

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SSM 5200 Automatic CV System for CV/QV/IV measurement Fully automated capacitance-voltage(CV),charge-voltage( Year(s) : 1997 Location : ASIA (North East)

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Hitachi SEM S-4160 Performance: Rresolution: 2.5 nm at 30kv Magnification: 20X - 300KX Electron Optics: Elec Location : ASIA (North East)

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Hitachi SEM S-5000 - 30KV 0.6nm - 1 KV 2.5nm with a test specimen *.Magnification 20X ~ 300,000X *. Stage Year(s) : 1996 Location : ASIA (North East)

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N&K 5700 CDRT Metrology system Broadband spectrometry for film thickness and trench profile measurements on p Year(s) : 2006 Location : ASIA (North East)

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NIDEK IM-11 5" Wafer Autoloader - Nidek wafer auto loader. - 5" wafer. - Power: 120V, 5A - Utility: Vacuum. Location : ASIA (North East)

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NIDEK 8" Wafer Autoloader IM-14 - 8" wafer. - Power: 120V, 5A - Utility: Vacuum. *. Fully refurbished. Fully Location : ASIA (North East)

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Nikon NWL641M Wafer Autoloader IC Inspection Wafer Loader Wafer Size : 4~6" Inspection mode : Micro & Tilt M Year(s) : 2001 Location : ASIA (North East)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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