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Used Metrology and inspection equipment

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1

Electroglas 1034X-6 Prober (1034X-6) ELECTROGLAS 1034X-6: Available with 4¿, 5¿ or 6¿ chucks. X-Y Travel: 6¿ Location : AMERICA North (USA-Canada-Mexico)

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Electroglass 1034X Wafer Probe Station * Included Option D * Included Temptronics heated hot plate Location : AMERICA North (USA-Canada-Mexico)

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EG 2010 (2010) Excellent condition, high or low, cognex. Location : AMERICA North (USA-Canada-Mexico)

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Cascade 11000 Cascade 8" manual probe station. * Two positioners - Model # MH2-B * Two xyz mounts allowing po Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL IV-Hg Ellipsometer (Auto EL IV-Hg Ellipsometer) *Rudolph Auto EL-IV-Hg Multi-Wavelength Auto Location : AMERICA North (USA-Canada-Mexico)

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Rudolph FTM ellipsometer *Precise: 1nm resolution *Fast Operation: 4 seconds per measurement *Set film type, Location : AMERICA North (USA-Canada-Mexico)

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Semitool STI 260C rinser dryer, now with 3" rotor, w/o controller Location : AMERICA North (USA-Canada-Mexico)

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TISI ID 20151105-05 Manufacturer KLA-Tencor Model P-20H Description Profiler Wafer Size 8 Location : ASIA (North East)

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Prometrix RS-55 t/c. Tencor RS-55 t/c * 50mm - 200mm Wafers, <5mohms/sp to > Megohm/sp * Measurement Range * Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL-IV Ellipsometer * Multi-Wavelength Automatic Ellipsometer. * User can select between 3 wavel Location : AMERICA North (USA-Canada-Mexico)

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Prometrix FT-750 Prometrix FT 750 patterned mapping system, single & double layer films, 100-200mm wafers, 4 Location : AMERICA North (USA-Canada-Mexico)

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Prometrix FT-650 * Film Thickness Mapping System * Measures single or multiple layers or oxide, nitride, Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics AFT 210 * EQP-00848-SI & EQP-00870-SI (has auto loader as pictured below) * Nanometrics 210 * Fil Location : AMERICA North (USA-Canada-Mexico)

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Gaertner L116S Ellipsometer * Fully Operational * PC controlled for measurement * Simple manual stage 8" capa Location : AMERICA North (USA-Canada-Mexico)

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Veeco Dektak 3030 Profilometer * EQP-00847-SI * Operating modes: Automatic, semi automatic, manual. * Stage Location : AMERICA North (USA-Canada-Mexico)

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Viscom X8011 PCB Plus Xray X-ray system X8011 PCB plus suited for 2D xray application for manual up to fully Location : AMERICA North (USA-Canada-Mexico)

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TISI ID 20151106-166 Manufacturer HITACHI Model PD-1000N Description Mask defect inspection Wafer Size V Location : ASIA (North East)

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Brand: SCREEN TISI ID 20151106-165 Manufacturer SCREEN Model STM-602 Description Film thickness inspectio Location : ASIA (North East)

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TISI ID 20151106-164 Manufacturer Tencor Model OmniMap RS35 Description Sheet resisitance inspection Wafer Location : ASIA (North East)

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Brand: Screen TISI ID 20151106-159 Manufacturer SCREEN Model ` Description Film thickness inspection(Lamb Location : ASIA (North East)

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TISI ID 20151106-163 Manufacturer RUDDLPH Model AutoEL-Ⅲ Description Film thickness inspection(Ellipsomete Location : ASIA (North East)

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Brand: SCREEN TISI ID 20151106-162 Manufacturer SCREEN Model VM-8000J Description Film thickness inspecti Location : ASIA (North East)

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TISI ID 20151106-161 Manufacturer Tencor Model OmniMap RS35C Description Sheet resisitance inspection Wafe Location : ASIA (North East)

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Please visit our website for updated information at www.allwin21.com Updated Brochure in2024: https://allwin Year(s) : 2024 Location : AMERICA North (USA-Canada-Mexico)

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Temptronics TP04390A THERMOSTREAM THERMAL INDUCING SYSTEM GRADE C; UNIT PASSED SELF DIAGNOSTICS. NO HDD. MISS Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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