Used Metrology and inspection equipment
1,302 resultsZeiss Axiotron HSEB Microscope Wafer Size 8" *. Modified auto stage movement. *. Attached additional scope he Location : ASIA (North East)
Price : On request
More detailsTencor HRP220 Step Height Measurement Sytem Wafer Size 8" Measurement Capabilities for meeting the requiremen Year(s) : 2000 Location : ASIA (North East)
Price : On request
More detailsLeica INS3000 Defect Inspection System Wafer Size 8" Year(s) : 1999 Location : ASIA (North East)
Price : On request
More detailsLeica INS3300 Defect Inspection System Wafer Size 12" Currently stocked in cleanroom. Year(s) : 2003 Location : ASIA (North East)
Price : On request
More detailsRudolph/August AXI 930 Macro Inspection System Wafer Size 8" Macro Inspection System to detect wafer level an Location : ASIA (North East)
Price : On request
More detailsRudolph/August AXI-S Macro Inspection System Wafer Size 8" Macro Inspection System to detect wafer level and Location : ASIA (North East)
Price : On request
More detailsTencor FLX-2908 Thin Film Stress Measurement Wafer Size 8" Installed in Clean-room. Location : ASIA (North East)
Price : On request
More detailsKLA-Tencor's 2401 Automated Macro Defect Inspection System Wafer Size 8" - Replacing the manual bright light Year(s) : 2001 Location : ASIA (North East)
Price : On request
More detailsKLA-Tencor's 2401 Automated Macro Defect Inspection System Wafer Size 8" - Replacing the manual bright light Year(s) : 2000 Location : ASIA (North East)
Price : On request
More detailsBIO-RAD/Accent QS-408M FT-IR Wafer Size 8" *. BIO-RAD FTIR QS-408. *. BPSG,EPI. *. Installed in Clean-room. * Year(s) : 1996 Location : ASIA (North East)
Price : On request
More detailsN&K 1700 Trench Depth & Thin film thickness Measurement Wafer Size 8" * .Available 100,125,150,200 mm by chuc Location : ASIA (North East)
Price : On request
More detailsN&K 3000 Trench Depth & Thin film thickness Measurement Wafer Size 6" Non-destructive measurements of Trench Location : ASIA (North East)
Price : On request
More detailsN&K 3700 RT Metrology System Wafer Size 8" Vintage 2004 Broadband spectrometry for film thickness on transpar Year(s) : 2004 Location : ASIA (North East)
Price : On request
More detailsN&K 8000 Trench Depth & Thin film thickness Measurement Wafer Size 8" Vintage 2007 Fully Automated Thin Film Year(s) : 2007 Location : ASIA (North East)
Price : On request
More detailsNanometrics Nanospec 9300 Thin Film Thickness Measurement Wafer Size 12" Vintage 2002 Currently 12" configure Year(s) : 2002 Location : ASIA (North East)
Price : On request
More detailsTencor P-2 Step Height Measurement System - Wafer Size 8" - Long Scan Profiler Measurement. - Standard Head w Location : ASIA (North East)
Price : On request
More detailsTencor P-20(H) Step Height Measurement Sytem - Wafer Size 8" - Scan Length: 210mm. - Scan Speed : 1㎛ ~ 25 mm/ Location : ASIA (North East)
Price : On request
More detailsQuanta 200 FEG SEM Field Emission Gun Scanning Electron Microscope fitted with OXFORD Instruments 6650-M EDS D Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details3D AOI Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAOI Serial Number SG51500054 Location : -
Price : On request
More detailsAOI Software: YesVision V2.8.2 Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b>1x KLA TENCOR, RS35, PROMETRIX Description</b> Resistivity Measurement Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: Semix/Tazmo <b>1x Semix/Tazmo, TR6132U, Inspection Description</b> Configuration 150mm Condition/Warr Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: Veeco Model: 1001 ION MILL Specifications • Used • Description Ion Mill • Configuration 10" Ion Mill ( Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: Leybold Model: U1100 Plus LEAK DETECTOR Specifications • Used • Description Leak Detector Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.