Used Semiconductor Equipment

Film thickness measurement Version: 200 mm Vintage: 01.06.2008 De-installed, warehoused. Can be inspected by Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Version: 200 MM Vintage: 01.05.1996 De-installed, warehoused. Can be inspected by appointment. Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Helium Leak Detector High Vacuum Pump Type Turbomolecular Pump Internal Calibrated Leak Included Built-In Roug Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Vertical Furnace Oxide Process Version: 200 mm Vintage: 01.08.1999 Comments: 1 Process Oxide 2 Wafer Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

2” to 6” (dia.) Wafer Capability Sheet Resistance Range: 1.1 mΩ/sq to 450 KΩ/sq Slice Resistivity Range: 4.19 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Model 340 Atomic Force Microscope Version: 300 MM Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Atomic Force Microscope (AFM) Version: 200mm Location : AMERICA North (USA-Canada-Mexico)

Price : On request

XeF2 Etching System Version: Inquire Vintage: 01.06.2018 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Prober Version: 300 mm Vintage: 01.05.2006 Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

3D Bump Height (Veeco) Version: 150 mm/200 mm Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Spin Rinse Dryer (Single Stack) Version: 150 mm Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

CD SEM for 65 nm mask measurement Version: Reticle / 150 mm Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Microscope inspection station Version: 200 mm Year(s) : 1995 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automatic Wedge Bonder Location : AMERICA North (USA-Canada-Mexico)

Price : On request

PVD Cluster tool Version: 200 MM Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

PVD Version: 200 MM Year(s) : 1995 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

-De-installed, warehoused, can be inspected by appointment -Was in working condition prior to de-installation Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

TM-330 Version: 150 mm/200 mm Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Deinstalled, warehoused. 120V 50 HZ SETUP Location : AMERICA North (USA-Canada-Mexico)

Price : On request

-Double Stack SRD (Set up for solar wafer use) -in excellent , operational condition -Has CE mark -See attache Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Inspection Microscope Version: 300 mm Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Convertible Bonder , Wedge to Ball Location : AMERICA North (USA-Canada-Mexico)

Price : On request

-Reaction Chamber Item CC1012-00100 s/n 10206 -RF Delivery Item CR1044-00201 s/n 10593 -Matching Network Item Year(s) : 1984 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

-Set up for load and unload of 4 inch wafers, cassette to cassette. -Sold Strictly "as is, where is", with con Year(s) : 1985 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brightfield Wafer Defect Inspection System Version: 200 mm Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)

Price : On request