Used Metrology and inspection equipment
1,302 resultsDouble sided measuring system, laser based, max panel size 225mm x 125mm, 100- 240 VAC 50/60 Hz. Like new Year(s) : 2021 Location : EUROPE (Western and Northern)
Price : On request
More detailsAOI system for 40 micron line & space, max panel size 762 x 610 mm, pin less alignment, panel types rigid, Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsThin Films measurement tool, 8300 XSE Film Thickness Analyzer, Semi Automatic loader (150, 200, and 300mm wafe Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsE-Testers / AOI Systems Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsTAN Ox equipment Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details.FTS60 Spectrometer - He-Ne Laser - IR Source - DTGS Detector - KBr Beam Splitter .Up to 12 Inch with PIKE MAP Year(s) : 1989 Location : ASIA (North East)
Price : On request
More detailsinsp: Optional Angle Camera Maker Nippon Miltech Location : ASIA (North East)
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More detailsNikon X-Tek Revolution - Nanotech Xray Tube: NanoTech 160 kV / 20 W Transmissive tube. Microfocus source wi Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTube: NanoTech 160 kV / 20 W Transmissive tube. Microfocus source with submicron feature recognition Detect Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMachine Software version: 7.146 Programming software: Valor Vplan(Mentor Graphics) Vplan software version: 12. Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSerial No. 3384 160 Kv Multi-Focus x-ray Tube / Open Tube 10W Max Target Power 70 degree angular view ADR-Aut Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details10MP-13.4um Top-Down Camera System 10MP Side-Viewer System INTELLI-SCAN Laser System 3 Layer Lighting System H Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAB-M Mask Aligner and UV Exposure System. 350W lamp housing with power supply, currently configure with 200W Location : AMERICA North (USA-Canada-Mexico)
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More detailsProber Location : ASIA (North East)
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More detailsVision Engineering Hawk Elite Optical Measuing microscope / Wafer Inspection High Precision Optical Measuring Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details[Specifications] Observation Method: Bright/Dark Field, Differential Interferometry Stage Stroke: 100x100mm T Location : ASIA (North East)
Price : On request
More detailsConfiguration • Microscope: BX61 (Z-axis motorized control) • Observation Method: Brightfield • Illumination: Location : ASIA (North East)
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More detailsMain Unit: OLS30-SU Light Source: 405nm Semiconductor Laser Detector: Circular Pinhole + Photomultiplier Z Dri Location : ASIA (North East)
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More detailschip: Mounter (flow: R>L) Year(s) : 2009 Location : ASIA (North East)
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More detailssem :FE-SEM Location : ASIA (North East)
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More detailsins: Profilometer Location : ASIA (North East)
Price : On request
More detailsProgrammable Semiautomatic 200 mm Analytical Prober. With Labmaster integrated probing environment software, u Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCD-SEM/ 6in Location : ASIA (North East)
Price : On request
More detailsCD-SEM/ 6in Location : ASIA (North East)
Price : On request
More detailsE-Testers / AOI Systems Year(s) : 2014 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.