Used Metrology and inspection equipment
1,030 results2D Inspection Max Board: 12"x18" Board Thickness: 1mm to 5mm Component Height: 3.0 mm (Top & Bottom) Left to R... Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Still installed in the cleanroom - The tool is connected in-line with a Nikon S204B scanner - The direction... Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVertical Furnace, Fast Thermal Oxidation process Version: 200 mm Vintage: 01.06.2001 CONTROLLER TYPE TS4000Z... Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAutomatic Prober Version: 300 mm Vintage: 01.06.2005 Inspection of these probers is welcomed by appointment.... Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAutomated Defect Inspection Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in the ne... Location : AMERICA North (USA-Canada-Mexico)
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More detailsFilm thickness measurement Version: 200 mm Vintage: 01.06.2008 De-installed, warehoused. Can be inspected by... Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsModel 340 Atomic Force Microscope Version: 300 MM Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAtomic Force Microscope (AFM) Version: 200mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsProber Version: 300 mm Vintage: 01.05.2006 Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More details3D Bump Height (Veeco) Version: 150 mm/200 mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope inspection station Version: 200 mm Year(s) : 1995 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTM-330 Version: 150 mm/200 mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrightfield Wafer Defect Inspection System Version: 200 mm Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTurboDISC mocvd SYSTEM Version: Inquire Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More detailsRTP Version: 300 mm Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsEquipment crated and stored in warehouse. Resolution ≦ 38 nm NA 1.35 Reduction ratio 1:4 Maximum exposure fiel... Location : AMERICA North (USA-Canada-Mexico)
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More detailsMacro Inspection System Version: 300 mm Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsE 2000 HT 300-4 Description: Diffusion Furnace Version: Solar Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFiber Laser Version: Solar Dimensions (WxHxD): 60x112x80 + 135x182x220 Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details-CE MARKED -INCLUDES ALL SOFTWARE DISKS AND ELECTRONIC MANUALS -ONLY USED FOR RUNNING A FEW PILOT LOTS -NEVER... Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSDI ID: 99830 Manufacturer: JORDAN VALLEY Model: JVX6200I Type: X-ray Metrology System Version: 300 mm Conditi... Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsHITACHI S4160 for Sale Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSpin Rinse Dryer Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFTIR System Version: 200 mm Vintage: 01.06.2000 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details3D Solder Paste Inspection Dual Lane 220V 1 Phase 50/60Hz Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.