Used Metrology and inspection equipment
1,079 resultsIllumination Type Reflected & Transmitted Light Binocular Angle 45° Eyepieces Model CFWN Magnificatio Location : AMERICA North (USA-Canada-Mexico)
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More detailsIllumination Type Reflected & Transmitted Light Binocular Angle 45° Eyepieces Model Nikon Magnificati Location : AMERICA North (USA-Canada-Mexico)
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More detailsCD-SEM Location : ASIA (North East)
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More detailsMicroscope Type Upright Microscope Configuration Brightfield Illumination Type Reflected & Transmitted Ligh Location : AMERICA North (USA-Canada-Mexico)
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More detailsSemi Auto Pad Shave Tool RSV Automation PDS01 Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)
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More details<b> Specification </b> Monitor 23-inch full HD (1920 x 1080 pixels) LCD monitor with 3D display function Photo Location : ASIA (North East)
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More detailsworking condition Year(s) : 2015 Location : EUROPE (Western and Northern)
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More details300mm Nickel Plated Chuck With H325C Chiller for Tri-Temp Operation (to -25°C) Hinged Test Head Manipulator Location : AMERICA North (USA-Canada-Mexico)
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More detailsOLYMPUS MX50A-F Reflected Light Microscope Five Position Motorized Turret with the Following Objective Lenses Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield & Darkfield Illumination Type Reflected Light Binocular Angle 45° Eyep Location : AMERICA North (USA-Canada-Mexico)
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More detailsVideo Measurement System Type TZ Head. LU Plan ELWD, 50x/.55 Objective Does not include computer of software Location : AMERICA North (USA-Canada-Mexico)
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More detailsTencor Candela 2 is an optical metrology system manufactured by KLA Corporation. It is primarily used in the Location : AMERICA North (USA-Canada-Mexico)
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More detailsJ.A. Woollam M-44 Spectroscopic Ellipsometer J.A. Woollam EC-270 Ellipsometer Controller J.A. Woollam LPS-420 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Stress Gauge Model 900TC-VAC Location : AMERICA North (USA-Canada-Mexico)
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More detailsAOI/SPI/PCB Inspection Conveyor Specifications PCB Size 50 mm x 50 mm to 450 mm x 350 mm wide (1.97" x 1.97" t Location : AMERICA North (USA-Canada-Mexico)
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More details[VHX-2000] Digital microscope Lens: VH-Z500R (Magnification: 500-5000×) Magnification automatic reading funct Location : ASIA (North East)
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More details<b> specification </b> Monitor 23-inch full HD (1920 x 1080 pixels) LCD monitor with 3D display function Phot Location : ASIA (North East)
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More detailsDescription OmniMap AutoRS75/tc Wafer Size Range Minimum 150 mm Maximum 200 mm Set Size 200 mm Year(s) : 1996 Location : EUROPE (Western and Northern)
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More details【specification】 Monitor Color LCD (IPS type) 23-inch 3D display function available Photographing device (CCD) Location : ASIA (North East)
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More details【specification】 Type Measurement objective lens Minimum measurement display 0.1μm/0.5μm/1μm (switchable) Meas Location : ASIA (North East)
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More details【specification】 ・Secondary electron image resolution: 3.0nm (acceleration voltage 30kV, high vacuum mode) 10n Location : ASIA (North East)
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More detailsDisk Inspection Microscope/Motorized Stage Microscope Type Upright Microscope Configuration Brightfield, DIC Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield & Darkfield Illumination Type Reflected Light Binocular Angle Variable Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield, Darkfield & DIC Illumination Type Hg Reflected Light Binocular Angle Location : AMERICA North (USA-Canada-Mexico)
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More detailsIon implanter Model E220 Year(s) : 1995 Location : ASIA (North East)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.