Used Metrology and inspection equipment
1,153 resultsMarantz AOI System Vintage: 2007 Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsMANUAL PROBE STATION PROBE UP TO 5″ WAFERS, FAST CHESSMAN MOVEMENT FOR LARGE GEOMETRIES AND JOYSTICK FOR FINE Location : AMERICA North (USA-Canada-Mexico)
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More detailsULTRACISION 860 200mm XY TRAVEL WITH 8″ DIAMETER CHUCK WITH B&L ZOOM 5 STEREO OPTICS (8-40X) OR 16-80X WITH 2 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBinocular Angle 45° Eyepieces Model 455043-0000 Magnification 10 X Field Number 23 mm Trinocular/P Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope Configuration Brightfield Illumination Type Reflected Light Binocular Angle 45° Eyepieces Mo Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield & DIC Illumination Type Xe Reflected Light Eyepieces Model KPL-W Location : AMERICA North (USA-Canada-Mexico)
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More detailsINS:AOI Year(s) : 2006 Location : ASIA (North East)
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More detailsInspection: AOI Year(s) : 2015 Location : ASIA (North East)
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More detailsProber Version: 300 mm Vintage: 01.05.2006 De-installed, warehoused. Inspection WITH POWER-UP DEMONSTRATION i Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWAFER FILM THICKNESS MEASUREMENT SYSTEM Vintage: 01.06.1991 KLA-Tencor Prometrix Film Thickness Probe W/ FT-65 Year(s) : 1991 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details【Main Specifications】 ・Controller: IM-6700 ・Measuring head: IM-6225 (wide field of view/variable illumination Location : ASIA (North East)
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More detailsThe Nanospec 210 is a wafer tester that has a film thickness measurement system. It has a 100 angstrom resol Location : AMERICA North (USA-Canada-Mexico)
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More detailsMeasurement Display Range … 200 A to 655,000 A (20nm to 65,000nm) Vertical Resolution … 5A (.5nm) Scan Length Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield Illumination Type Reflected Light Binocular Angle 45° Eyepieces Mo Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Type Microzoom Multiple Objectives Models Bausch and Lomb 2.25 X 0.04 N.A. 8 X 0.15 N.A. 25 X 0.3 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope for machines (without stand) Objective: Nikon G-AL 0,29 x Oculars: 20 x Illumination: up to 29 x o Location : EUROPE (Western and Northern)
Price : On request
More detailsThis tool includes chem cabinets and Temperature and Humidity module. The controller is programed in DOS. Pump Location : EUROPE (Western and Northern)
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More detailsMicroscope: Measuring Location : ASIA (North East)
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More detailsAnti Static Probes YES Heated Nitrogen YES Rotors Included YES Controller Type Microprocessor Controller T Location : AMERICA North (USA-Canada-Mexico)
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More detailsSubstrate Size Up to 125mm Wafer Size Range Maximum 125 mm Controller Type Microprocessor Controller Ty Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBinocular Angle 60° Eyepieces Magnification 10 X Field Number 22 mm Magnification Range 10 X - 40 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b> Specification </b> ・Controller: IM-6600 ・Measuring head: IM-6120 ・Photograph element: 6.6 million pixels C Location : ASIA (North East)
Price : On request
More detailsParmi SPI Tabletop Solder Paste Inspector Model Number: 50T Notes: • Measuring principle: Laser optical trian Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMachine Software version: 7.146 Programming software: Valor Vplan(Mentor Graphics) Vplan software version: 12. Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b> specification </b> ・Controller: IM-6500 ・Measuring head: IM-6010 ・Photograph element: 6.6 million pixel mo Location : ASIA (North East)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.