Used Metrology and inspection equipment
1,101 resultsThe Electroglas 2001 wafer probers are extremely accurate, modularly designed automatic wafer probers, configu Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Prober Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)
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More details– Operating System: Win 2000 – Probe Card Holder: Rectangular – Power Supply: 110VAC – EGCMD 9.2.1 SP5 – Chuck Location : AMERICA North (USA-Canada-Mexico)
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More detailsFilm Thickness Measurement System Configuration 200 MM Wafer Configuration Year(s) : 1998 Location : AMERICA North (USA-Canada-Mexico)
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More details6″ ANALYTICAL PROBE STATION MOTORIZED WITH JOYSTICK MITITOYO HIGH POWER ZOOM OPTICS (AUTOMATIC STEPPING) Location : AMERICA North (USA-Canada-Mexico)
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More detailsSEM/Scanning Electron Microscope Year(s) : 2016 Location : ASIA (North East)
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More detailsSEM/FE-SEM Location : ASIA (North East)
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More detailsInsp: YAG Welding Alignment System Location : ASIA (North East)
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More detailsEVG 620 MASK ALIGNER consisting of: - Model: EVG620 (Upgraded from a 420) - Manual Mask Aligner - Topside Ali Location : AMERICA North (USA-Canada-Mexico)
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More detailsInspection: Surface Defect/4-6in Year(s) : 2017 Location : ASIA (North East)
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More detailsWafer Size Range Minimum 50 mm Maximum 150 mm Microscope Type Microzoom X-Y Optics Motion YES Vacuum Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 60° Eyepieces Model GSWH 10x/22 Magnification 10 X Field Number 22 mm Magnificatio Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Model GSWH20X/12 Magnification 20 X Field Number 12 mm Focusing Y Location : AMERICA North (USA-Canada-Mexico)
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More details4×4″ travel Three objectives (5x, 10x, 20x) P1 10x/20 eyepieces Location : AMERICA North (USA-Canada-Mexico)
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More details17"x19" Work Area 208v 1Phase 50/60Hz Maximum Board Size: 18” x 22” (458mm x 560mm) Minimum Component Size: 0. Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMETAPHOT 6X6″ STAGE 2X2″ TRAVEL 5X, 10, 20X, BINOCULAR HEAD, TRINOCULAR HEAD B/F OPTION Location : AMERICA North (USA-Canada-Mexico)
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More details9.5in-6in stage .000mm .0000in 4 objective slots Location : AMERICA North (USA-Canada-Mexico)
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More details5X, 20X, 100X OBJECTIVES, BINOCULAR HEAD Location : AMERICA North (USA-Canada-Mexico)
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More details160 kV 20 W Nanotech source, feature recognition 500 nm. 5 axis manipulator, max supported weight 5 kg. Max sa Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More details<b> Specification </b> Total magnification 15-94.5× Depression angle 20° Zoom 1-6.3× Working distance approx Location : ASIA (North East)
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More detailsHIGH POWER MITUTOYO OPTICS MANUAL 6X6″ MOVEMENT, 6″ GOLD PLATED CHUCK Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size: 200mm Desktop Mercury Probe CV Mapper CV92A Embedded computer and a PC Up to 200 mm - 8 inch capab Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe ASET-F5x thin film metrology system can measure materials across a continuous wavelength spectrum from 1 Location : AMERICA North (USA-Canada-Mexico)
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More detailsIllumination Type Reflected & Transmitted Light Binocular Angle 45° Eyepieces Model CFWN Magnificatio Location : AMERICA North (USA-Canada-Mexico)
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More detailsIllumination Type Reflected & Transmitted Light Binocular Angle 45° Eyepieces Model Nikon Magnificati Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.