Menu

Nanometrics 210

Ref : 1741123-9
Condition : Used
Manufacturer : Nanometrics
Model : 210
Year(s) : -
Quantity : 1
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)
Last check : 05 Aug. 2020

Thin film thickness measurement system for transparent films on 75mm to 150mm wafers, measures 14 standard film types including photoresists, polyimides, polysilicon, oxides, and nitrides in ranges from 100A to 500kA. Typical measurement time 2.5 seconds.

Other machines similar to Nanometrics 210

1
Location : AMERICA North (USA-Canada-Mexico)
1
Location : AMERICA North (USA-Canada-Mexico)
1
Location : AMERICA North (USA-Canada-Mexico)
Year(s) : 1998
1
Location : AMERICA North (USA-Canada-Mexico)
Year(s) : 1997