Tencor

Ref : 1874123-9-GO

Condition : Used

Manufacturer : Tencor

Model : -

Year(s) : -

Quantity : 0

Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)

Last check : 06 Sep. 2018

Tencor OmniMap NC-110

* Non-Contact Resistivity System.
* Measures complex aluminum and tungsten multilayer metalization schemes such
as TiN/Al/TiN or W/TiN.
* Realistic process control by measuring actual product wafers
Measurement Performance.
* Measurement Range: 1mW/sq to 1W/sq. Accuracy: +/-1% over
calibrated range. Precision: 1200 sites). 1-30 site programmable
quick test.

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