Used Metrology and inspection equipment
1,311 resultsStepper Location : ASIA (North East)
Price : On request
More details- X and Y axis micrometers on stage - 12" diameter screen - 20X objective lenses - 115V - 50/60Hz - 2A Location : AMERICA North (USA-Canada-Mexico)
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More detailsBenchtop Conveyor UV Curing System Lamp adjustable to any angle relative to part travel Lamp height adjustable Location : AMERICA North (USA-Canada-Mexico)
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More details- 1 Phase - 50/60 Hz 2011 Vintage Year(s) : 2011 Location : EUROPE (Western and Northern)
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More detailsWafer Inspection System Model Optistation 3100 Location : EUROPE (Western and Northern)
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More detailsRUDOLPH WV320 Wafer size: 300mm Process: measurement Location : EUROPE (Western and Northern)
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More detailsAutomated Optical Inspection System 3D Inspection DOM: 03/2018 Multi-function system with top-down viewing, C Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More detailsTeach Camera 5 Axis, 3 heads Operating system: Windows 7 Pro Reservoir: 1 gallon Material: Polyurethane Cons Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSMT Automatic Optical Inspection Model MV-6E OMNI Location : EUROPE (Western and Northern)
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More detailsInline X-Ray & Optical Inspection X7056-II Vintage : 2023 Operating hours : 1500 X-Ray: * Seales X-ray tube * Year(s) : 2023 Location : EUROPE (Western and Northern)
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More detailsAOI 3D S3088 ultra chrome Vintage: 2019 Working hours: 17 000 3D sensor technology: * Z-resolution: 0.5 micro Year(s) : 2019 Location : EUROPE (Western and Northern)
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More detailsCyberoptics SE600 3D SPI & SQ3000 3D AOI Package - 2020 (1) CyberOptics SE600-II 3D SPI DOM: 12/2019 OS: Wind Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
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More detailsX-ray Inspection System Standalone Closed Tube 160kV 70 degree Oblique view 1,500 X Geometric Magnification (7 Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDOM: 12/2019 OS: Windows 10 SW: 5.8.1.11 Came to PFI with VERY low production use. Gauge R&R run & is perfect Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDOM: 12/2019 OS: Windows 10 SW: 5.6.1.175 With: PXS 3d Sensor & MRS Came to PFI with VERY low production use. Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
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More detailsCD-SEM Location : ASIA (North East)
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More details- Light-tight enclosure designed for wafer probers - Cable ports on both sides of the box - Easy-lift Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafers 8" FIB Location : AMERICA North (USA-Canada-Mexico)
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More details- Condition: As-Is / Where-Is - Included Components: - PC Tower - Monitor Location : AMERICA North (USA-Canada-Mexico)
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More detailsNikon X-Tek Revolution - Nanotech Xray Tube: NanoTech 160 kV / 20 W Transmissive tube. Microfocus source wi Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsNikon NWL860 Wafer Loader With ISS200 Microscope Download the documents below for more information: NWL860 cat Year(s) : 2000 Location : EUROPE (Western and Northern)
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More detailsInspection: AOI Location : ASIA (North East)
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More detailsManufacturer: F&S BONDTEC Semiconductor GmbH Semi-automatic gold-ball wirebonder with pull & shear heads. Sp Year(s) : 2005 Location : EUROPE (Western and Northern)
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More detailsFeatures: - 10 user-programmable profiles - Each profile supports up to 3 consecutive bake methods - Contr Location : AMERICA North (USA-Canada-Mexico)
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More details- Wafer Size Range: 3" to 8" (up to 200 mm) - Control System: Labmaster integrated probing environment softw Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.