AMERICA North (USA-Canada-Mexico)
KLA-Tencor UV1250SE Metrology
KLA UV1250SE thin film measurement and UV Spectrospoic Ellipsometry system. This system is the ultimate single-solution tool which simultaneously measure film thickness, refractive index, extinction coefficient, for single-layer or multi-layer thin film stacks. This system is a non-destructive optical characterization,& spectroscopic ellipsometry (SE)system,which combines the power of spectroscopic ellipsometry and the functionality of broadband UV spectrophotometry.