Ref : 1885648-9
Condition : Used
Manufacturer : KLA-Tencor
Model : -
Year(s) : -
Quantity : 0
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)
Last check : 28 Sep. 2018

KLA-Tencor UV1250SE Metrology

KLA UV1250SE thin film measurement and UV Spectrospoic Ellipsometry system. This system is the ultimate single-solution tool which simultaneously measure film thickness, refractive index, extinction coefficient, for single-layer or multi-layer thin film stacks. This system is a non-destructive optical characterization,& spectroscopic ellipsometry (SE)system,which combines the power of spectroscopic ellipsometry and the functionality of broadband UV spectrophotometry.