Used Metrology and inspection equipment
1,259 resultsmeasure: Resistivity mapping system/6in Location : ASIA (North East)
Price : On request
More detailsAligner/Mask Year(s) : 2007 Location : ASIA (North East)
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More detailsWindows 10 OS Precision XY gantry. High-speed linear motors with closed loop high resolution linear encoders. Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDOM: 12/19/2022 3D Vision – 80 Mpixel 3D system (16 cameras, 4 projectors): Distortion free 3D triangulation Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSpecifications Resolution: High Vacuum mode: 3nm (30kV)*, 4nm (20kV), 8nm (3kV), 15nm (1kV) Low Vacuum mode: 4 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSoftware version: 10.2.4.0101 This is a CS900 running CS920 software Tool powers on and initializes Does not h Year(s) : 2017 Location : EUROPE (Western and Northern)
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More detailsWarehoused It was in Working Condition before buying it. No EDX Vintage : 2000. It's completer with HDD and So Year(s) : 2000 Location : EUROPE (Western and Northern)
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More detailsWafer Sizes: 6"/150mm Vintage: 2003 EVG 620 Bond Aligner OEM Model Description Double sided alignment system Year(s) : 2003 Location : EUROPE (Western and Northern)
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More detailsDie level inspection on tape & reel and waffle plate. Manufacturer Exclusive Master Power Requirements 230 V Year(s) : 2016 Location : EUROPE (Western and Northern)
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More detailsSpecifications ・Controller: IM-6600 ・Measuring Head: IM-6120 ・Image Sensor: 6.6 Megapixel CMOS (Monochrome) ・D Location : ASIA (North East)
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More detailsHours: 10 hours - Demo Machine! Sealed Micro-Focus X-Ray Tube 90KV Current Range 10-200 μA Max Output Power 8W Location : AMERICA North (USA-Canada-Mexico)
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More detailsSEM S-4700 with EDAX Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)
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More detailsmeasurement: Non-Contact type resistance measurement Year(s) : 2012 Location : ASIA (North East)
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More detailsCategory: Metrology Maker: KLA Model: MIS-200 Wafer Size: 200 Process: Inspection Config Review inspection. N Location : EUROPE (Western and Northern)
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More details50Hz/60Hz Missing Parts: Controller PCB cards, Handling Robot and Controller 2005 Vintage Year(s) : 2005 Location : EUROPE (Western and Northern)
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More detailsSEMITOOL 1-CHAMBER 300MM SPRAY ACID TOOL (SAT) consisting of: - Model: SAT-1100S1PSHU - Spray Acid Tool (SAT) Location : AMERICA North (USA-Canada-Mexico)
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More detailsMeasurement: Film thickness/6in Year(s) : 2020 Location : ASIA (North East)
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More detailsInspection: Thermawave Year(s) : 1998 Location : ASIA (North East)
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More detailsCompletely maintained Scanning Electron Microscope with IXRF EDS detector included Location : AMERICA North (USA-Canada-Mexico)
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More detailsWet Process Equipment 200mm Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAOI for rigid panel or flex reel to reel feed, rigid panels max panel size 515mm x 515mm. Year(s) : 2019 Location : EUROPE (Western and Northern)
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More details- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distan Year(s) : 1997 Location : EUROPE (Western and Northern)
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More detailsCritical Dimension Scanning Electron Microscopes, 300mm, s/n: U-666 Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More detailsParticle counter for transparent wafer 6 Inch As is cold down Was working before de-install, Year(s) : 2011 Location : EUROPE (Western and Northern)
Price : On request
More detailsCentura TCCP – TAN Ox Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.