KLA-Tencor AIT II

Ref : 253033

Condition : Used

Manufacturer : KLA-Tencor

Model : AIT II

Year(s) : 2000

Quantity : 1

Location : Seller or machines location:
United States (USA)

Last check : 26 Feb. 2025

- Type: Defect Inspection Tool
- Wafer Size: 200 mm
- Software Version: 5.3.17
- Interface: CIM SECS, GEM
- Process: Defect inspection for semiconductors
- Configuration: AIT II with ADC
- Tool Status: Connected
- Tool Available Date: 2024-01-16
- Condition: OK
- Hardware: Main system (1 unit, OK)

Other machines similar to KLA-Tencor AIT II

1 KLA-Tencor P-16+

Location : AMERICA North (USA-Canada-Mexico)

1 KLA-Tencor ASET F5x

Location : AMERICA North (USA-Canada-Mexico)

1 KLA-Tencor Surfscan SP 1 DLS Unpatterened Surface Inspection

Location : EUROPE (Western and Northern)

1 KLA-Tencor OP3260I

Location : ASIA (North East)

Year(s) : 1998