KLA-Tencor P-10

- Manual wafer load profilometer
- Max wafer size: 8"/200mm
- Computer controlled
- Measures roughness, waviness, step height, and other surface characteristics
- Measures micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 60-mm scan.i thin
- Built-in PC computing power
- Operating System: Windows 3.1
- Windows base software control and data analysis
- Brand new stylus
- Brand new LCD monitor
- Lab Table for KLA P10 Profiler
- Operations Manual