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Used Metrology and inspection equipment

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Refurbished Hitachi S-4800 II. Wafer : 200mm. Vintage : 2004. Secondary electron image resolution: 1.0nm (15kV Year(s) : 2004 Location : EUROPE (Western and Northern)

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The KLA Tencor P10 is a manual-load stylus profiler primarily used for measuring surface characteristics like Location : EUROPE (Western and Northern)

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Metrology Model S-5000H SEM Year(s) : 1998 Location : EUROPE (Western and Northern)

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Sold in good working condition Refurbished WaferMark Sigmaclean Laser Marking Machine Vintage:2001 With Ultra Year(s) : 2001 Location : EUROPE (Western and Northern)

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Darkfield Inspection Metrology Equipment Date of Manufacture: 2019-07-01 Currently Configured for: 200mm Altai Year(s) : 2019 Location : EUROPE (Western and Northern)

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High-Precision Automated Optical Inspection Built for Reliable PCB Quality Control Key Features • High-Precis Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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DOM: 3/15/2023 Linear motor motion stage Max board size: 510 x 510 mm Board thickness: .4 - 7.0mm PCB Cleara Year(s) : 2023 Location : AMERICA North (USA-Canada-Mexico)

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It utilizes a four-point inline probe head to apply an electrical current and measure voltage drop, calculatin Location : AMERICA North (USA-Canada-Mexico)

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• Measurement Technology: White Light Interferometry (WLI) • Measurement Technology: Vertical Scanning Interfe Location : AMERICA North (USA-Canada-Mexico)

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>300mm X 300mm XY Travel Rotating Stage Mounted on Granite Surface Plate Vibration Isolation 2ea DSCDL Positio Location : AMERICA North (USA-Canada-Mexico)

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The 2011 SPEA 4020 Flying Probe is a high-performance fixtureless PCB test system designed for manufacturers Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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High-Precision Fixtureless Flying Probe Test System for PCB Inspection Key Features • Fixtureless Flying Prob Location : AMERICA North (USA-Canada-Mexico)

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• Observation Methods: Brightfield • Observation Methods: Darkfield • Observation Methods: Differential Interf Location : ASIA (North East)

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Stereozoom with 8:1 zoom ratio 20x/13 eyepieces 1x APO objective Boom stand Fiber ring illuminator Location : AMERICA North (USA-Canada-Mexico)

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• Sensor: 1/2.5" CMOS • Resolution: 1920 × 1080 (1080p Full HD) • Color Depth: 24-bit • Aspect Ratio: 16:9 • F Location : AMERICA North (USA-Canada-Mexico)

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Cyberoptics SQ3000 3D AOI Part No: 8027909 DOM: 12/2021 457 x 308 mm (18” x 12”) inspection area PSX325 S Year(s) : 2021 Location : AMERICA North (USA-Canada-Mexico)

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Pemtron ATHENA L 3D AOI DOM: 3/15/2023 Max board size: 510 x 510 mm Board thickness: .4 - 7.0mm PCB Clearance Year(s) : 2023 Location : AMERICA North (USA-Canada-Mexico)

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Vision Engineering Hawk Elite Optical Measuing microscope / Wafer Inspection High Precision Optical Measuring Location : AMERICA North (USA-Canada-Mexico)

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Omron VT-RNS-II Inline AOI Machine 120V Single phase Max board 18x20" Board size : L Good working order M Location : AMERICA North (USA-Canada-Mexico)

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Mirtec MV-3L Benchtop AOI 5 Cameras DOM: 02/2018 Windows 7 - SW: Mirtec Inspector 5.5.400.327 5 Cameras: Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)

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Nikon X-Tek Revolution - Nanotech Xray Tube: NanoTech 160 kV / 20 W Transmissive tube. Microfocus source wi Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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DOM: February 2015 457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras In Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Tube: NanoTech 160 kV / 20 W Transmissive tube. Microfocus source with submicron feature recognition Detect Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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Max PCB: 510 x 510 mm Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Machine Software version: 7.146 Programming software: Valor Vplan(Mentor Graphics) Vplan software version: 12. Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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