Used Metrology and inspection equipment
1,297 results- 6" Nikon Stage with 6", 5", 4" pockets - 360 degree stage rotation - Auto Turret with 5x, 10x, 20x, 50x, 100 Location : AMERICA North (USA-Canada-Mexico)
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More details- SN: 131001B - Windows 7 PC Location : AMERICA North (USA-Canada-Mexico)
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More detailsSubstrate Size 6" Wafer Size 150 mm Wafer Size Range Maximum 150 mm Controller Type Microprocessor Controller Location : AMERICA North (USA-Canada-Mexico)
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More detailsOlympus BX60 Microscope consisting of: - Model: BX60F5 - 4" Wafer Stage - Bright Field & Dark Field - Turret Location : AMERICA North (USA-Canada-Mexico)
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More detailsNikon LV150 Microscope consisting of: - Model: LV150 - 6" Nikon Stage with 6", 5", 4" pockets - 360 degree st Location : AMERICA North (USA-Canada-Mexico)
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More detailsNikon NEXIV VMR-3020 CNC Video Measuring System The Nikon NEXIV VMR-3020 is a high-precision, automated 3D no Location : AMERICA North (USA-Canada-Mexico)
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More details• Binocular Angle: Ergonomic • Eyepiece Model: C-W 10xB/22 • Eyepiece Magnification: 10 X • Field Number: 22 m Location : AMERICA North (USA-Canada-Mexico)
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More detailsVision Engineering Hawk Elite Optical Measuing microscope / Wafer Inspection High Precision Optical Measuring Location : AMERICA North (USA-Canada-Mexico)
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More detailsInspection system Manufacturer Creden Location : EUROPE (Western and Northern)
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More detailsWafer Size 6" Vintage 2014-12 Tool's Condition AS-IS The Candela CS920 wafer inspection system is designed f Year(s) : 2014 Location : ASIA (North East)
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More detailsDarkfield Inspection Metrology Equipment Date of Manufacture: 2000-04-01 Currently Configured for: 200mm Defec Year(s) : 2000 Location : EUROPE (Western and Northern)
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More detailsMagnification: 15 to 100,000 times *Varies depending on observation mode, subject, and installation environmen Location : ASIA (North East)
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More details• Magnification: 7X to 2000X • Variable Magnification: 7X to 500X • Resolution: 10 microns (depending on magni Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)
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More detailsHigh-temperature Ion Implanter for SiC IH-860PSIC The Ion Implanter IH-860DSIC is a system especially designed Location : AMERICA North (USA-Canada-Mexico)
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More detailsTakaya APT-9411CE Flying Probe Test System Vintage: 2017 4 Top side probes Single phase, 50/60 Hz 2.2 kVA 240V Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More details・IC pretreatment method: Automatic acid addition and aeration treatment ・Carrier gas: High-purity air ・Sample Location : ASIA (North East)
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More detailsSetup for 200mm Wafers Comes with Neslab CFT-25 Chiller, PC, Keyboard, Monitorand Printer. Removed from Se Year(s) : 1996 Location : EUROPE (Western and Northern)
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More detailsHard Drive and software not included Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsMetrology Model S-5000H SEM Year(s) : 1998 Location : EUROPE (Western and Northern)
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More detailsObservation method: Transmitted phase contrast, fluorescent observation ・Total magnification: 40, 100, 200, 40 Location : ASIA (North East)
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More details・Total magnification: 40, 100, 200, 400x Eyepiece: WH10x/22 ・Objective lenses: UPlanFL4x, HMC10xLWD PLAN, HMC2 Location : ASIA (North East)
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More details• Vacuum Chuck Diameter: 6 in • X-Y Stage Travel: 6 in x 6 in • Microscope X-Y Travel: Included • Microscope B Location : AMERICA North (USA-Canada-Mexico)
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More details• Impact Mechanism: Steel impactor driven by magnetic coils • Cooling Medium: Liquid nitrogen required • Vial Location : AMERICA North (USA-Canada-Mexico)
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More detailsHead: Trinocular Eyepieces: 10x Light: Reflected and Transmitted light module w/ B.F. & D.F. settings Nosepi Location : AMERICA North (USA-Canada-Mexico)
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More detailsIncludes Computer (current OS), monitor, keyboard, mouse New M3 software Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.