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Nanometrics 8000 XSE

Ref : 1741139-9
Condition : Used
Manufacturer : Nanometrics
Model : 8000 XSE
Year(s) : 1998
Quantity : 1
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)
Last check : 05 Aug. 2020

Model: 8000 XSE.
Cassette to Cassette Thin Film measurement system w/Ellipsometer 8" wafer stage, Operating system - IBM OS,J.A. Woolham M44 Ellipsometer, LPS-300 75W light source, EC 270, 5-8" pre-aligner 115V, 5 amp, 30/60Hz

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