Used Metrology and inspection equipment
1,303 results- Light-tight enclosure designed for wafer probers - Cable ports on both sides of the box - Easy-lift Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafers 8" FIB Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Condition: As-Is / Where-Is - Included Components: - PC Tower - Monitor Location : AMERICA North (USA-Canada-Mexico)
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More detailsNikon X-Tek Revolution - Nanotech Xray Tube: NanoTech 160 kV / 20 W Transmissive tube. Microfocus source wi Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsNikon NWL860 Wafer Loader With ISS200 Microscope Download the documents below for more information: NWL860 cat Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsInspection: AOI Location : ASIA (North East)
Price : On request
More detailsManufacturer: F&S BONDTEC Semiconductor GmbH Semi-automatic gold-ball wirebonder with pull & shear heads. Sp Year(s) : 2005 Location : EUROPE (Western and Northern)
Price : On request
More detailsFeatures: - 10 user-programmable profiles - Each profile supports up to 3 consecutive bake methods - Contr Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Wafer Size Range: 3" to 8" (up to 200 mm) - Control System: Labmaster integrated probing environment softw Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsOptical Film Mapper/6in. Location : ASIA (North East)
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More detailsmea: Stress measurement system Location : ASIA (North East)
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More detailsMeasurement: Film thickness Year(s) : 2010 Location : ASIA (North East)
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More detailsPhotoluminescence Mapping System Year(s) : 2000 Location : ASIA (North East)
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More detailsAli: Laser marker/6in. Location : ASIA (North East)
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More detailsMECHANICS Basic unit with 16 test probes (8 top, 8 bottom) Variable board fixing system, multi board test Max. Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsAOI System YOM 11/2021 Year(s) : 2021 Location : EUROPE (Western and Northern)
Price : On request
More detailsF30 Inspectiontool Power Requirements 200-240 V 10.0 A 50/60 Hz CE Marked YES Condition Fair Year(s) : 2011 Location : EUROPE (Western and Northern)
Price : On request
More detailsAOI Desktop inspection system including keyboard Location : EUROPE (Western and Northern)
Price : On request
More details- Condition Note: Excellent condition, fully reconditioned to factory specifications - Return Policy: 30-day Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAOI suitable for inner- and outer layers, still in production on shopfloor Year(s) : 2005 Location : EUROPE (Western and Northern)
Price : On request
More details- Touchscreen operator interface for basic operation - PC-based software for recipe creation and editing - Year(s) : 2019 Location : EUROPE (Western and Northern)
Price : On request
More details- Type: AOI (Automated Optical Inspection) - Z-resolution: 0.5 µm - Z-range: Up to 30 mm (1.2") - Angled v Location : EUROPE (Western and Northern)
Price : On request
More details- Type: X-ray fluorescence spectrometer - Control Software: X-Ray Station - Included: Laptop (Windows XP) Location : EUROPE (Western and Northern)
Price : On request
More detailsChi: Radial Inserter Location : ASIA (North East)
Price : On request
More detailsECD310, 300mm Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.