Used Metrology and inspection equipment
1,300 resultsFeatures: - 10 user-programmable profiles - Each profile supports up to 3 consecutive bake methods - Contr Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Wafer Size Range: 3" to 8" (up to 200 mm) - Control System: Labmaster integrated probing environment softw Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsOptical Film Mapper/6in. Location : ASIA (North East)
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More detailsmea: Stress measurement system Location : ASIA (North East)
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More detailsMeasurement: Film thickness Year(s) : 2010 Location : ASIA (North East)
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More detailsPhotoluminescence Mapping System Year(s) : 2000 Location : ASIA (North East)
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More detailsAli: Laser marker/6in. Location : ASIA (North East)
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More detailsMECHANICS Basic unit with 16 test probes (8 top, 8 bottom) Variable board fixing system, multi board test Max. Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsAOI System YOM 11/2021 Year(s) : 2021 Location : EUROPE (Western and Northern)
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More detailsF30 Inspectiontool Power Requirements 200-240 V 10.0 A 50/60 Hz CE Marked YES Condition Fair Year(s) : 2011 Location : EUROPE (Western and Northern)
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More detailsAOI Desktop inspection system including keyboard Location : EUROPE (Western and Northern)
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More details- Condition Note: Excellent condition, fully reconditioned to factory specifications - Return Policy: 30-day Location : AMERICA North (USA-Canada-Mexico)
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More detailsAOI suitable for inner- and outer layers, still in production on shopfloor Year(s) : 2005 Location : EUROPE (Western and Northern)
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More details- Touchscreen operator interface for basic operation - PC-based software for recipe creation and editing - Year(s) : 2019 Location : EUROPE (Western and Northern)
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More details- Type: AOI (Automated Optical Inspection) - Z-resolution: 0.5 µm - Z-range: Up to 30 mm (1.2") - Angled v Location : EUROPE (Western and Northern)
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More details- Type: X-ray fluorescence spectrometer - Control Software: X-Ray Station - Included: Laptop (Windows XP) Location : EUROPE (Western and Northern)
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More detailsChi: Radial Inserter Location : ASIA (North East)
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More detailsECD310, 300mm Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAligner/Mask Year(s) : 2011 Location : ASIA (North East)
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More detailsAligner/Mask Location : ASIA (North East)
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More detailsProcess: UNDOPED-POLY INSPECTION DATE 2024-08-21 General Info 1 System Layout Main , Utility 2 System Type L- Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsKLA-TENCOR ASET F5x THIN FILM MEASUREMENT SYSTEM consisting of: - Model: ASET F5x - Can be configured to Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsType: Microscope Power Requirements: 100/120 Vac or 220/240V 50–60 Hz 10 W Digital Readout: Included Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR ASET F5x THIN FILM MEASUREMENT SYSTEM consisting of: - Model: ASET F5x - Can be configured to Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTool ID T-103 Process COATER, DEVELOPER Wafer Size 200mm Year(s) : 1996 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.