Used Metrology and inspection equipment
1,287 resultsSmall 18” dia. footprint but handles all wafer sizes up to 300mm. Cures most UV tape in 30 seconds. Ultra long Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDOM: 12/2019 Zenith 2 (8Way) SL Single Lane, KOH YOUNG 3D Automated Optical Inspection System Measurement Ca Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrightfield Inspection Metrology Equipment Date of Manufacture: 1994-02-01 Currently Configured for: 200mm Pat Year(s) : 2018 Location : EUROPE (Western and Northern)
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More detailsMacro-Defect Metrology Equipment Currently Configured for: 200mm Macro Defect Inspection Software Version: 3.6 Location : EUROPE (Western and Northern)
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More detailsWafer Size Range Minimum 200 mm Maximum 200 mm Condition Good Exterior Dimensions Width 61.811 Year(s) : 1999 Location : EUROPE (Western and Northern)
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More detailsWafer Size Range Minimum 200 mm Maximum 200 mm Condition Good CE Marked YES Exterior Dimensions Year(s) : 1998 Location : EUROPE (Western and Northern)
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More detailsConfiguration Resolution: 15kv : 1.5nm 1kv : 2.5nm Magnification High mode: 30x ~ 500,00 Location : United States (USA)
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More detailswith EDS HORIBA X-max 50mm2 Year(s) : 2012 Location : United States (USA)
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More details• Beam Splitter: Ge-deposited KBr • Detector Type: DLATGS with temperature control • Wavenumber Range: 7800 to Location : ASIA (North East)
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More detailsMagnification 10 X Field Number 26 mm Trinocular/Phototube Provided YES Multiple Objectives Models BD Plan 5x Location : AMERICA North (USA-Canada-Mexico)
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More detailsKarl Suss MJB3 Aligner Working condition Contact 1:1 aligner IR capability (back side alignment) Approximate e Location : EUROPE (Western and Northern)
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More detailsMirtec MV7U Inline AOI - 2011 DOM: 2/18/2011 SW: Mirtec Inspector 4.5.6.0 OS: Windows XP 5 Cameras: - 1 top Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Mask Inspection Parts Machine KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) Year(s) : 2005 Location : EUROPE (Western and Northern)
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More details• System Type: Mask aligner and UV exposure system • Application: Laboratory use • Application: Small series p Location : AMERICA North (USA-Canada-Mexico)
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More detailsWAFER SIZE 150mm Year(s) : 2001 Location : EUROPE (Western and Northern)
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More detailsMetrology Model Prometrix UV-1050 Location : EUROPE (Western and Northern)
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More detailsMirtec MV-6e Omni 3D AOI- 2016 #17161122-3535 DOM: 11/2016 SW: Mirtec inspector 5.5.400.332 Win 7 Lighting: Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsIntegrated Metrology System Model 9010bVIS Year(s) : 2002 Location : EUROPE (Western and Northern)
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More detailsThe NanoSpec 6100 is a fast, reliable, low cost tabletop film thickness and mapping system that provides a br Location : EUROPE (Western and Northern)
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More detailsScanning Capabilities: Scan Resolution: Down to 0.4 µm Maximum Scanned Volume (ØxH): 450 mm x 640 mm Maximum S Location : AMERICA North (USA-Canada-Mexico)
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More detailsScanning Capabilities: Voxel Resolution: Down to 350 nm/voxel Maximum Scanned Volume (ØxH): 320 mm x 420 mm In Location : AMERICA North (USA-Canada-Mexico)
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More detailsScanning Capabilities: Highest Resolution: 2 µm (JIMA & QRM Charts) Maximum Scanned Volume (ØxH): 185 mm x 390 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpecifications: Accuracy XY: E2 2.5+5L/1000 Z:3.5+6L/1000 Repeatability: 2.5µm Measuring Range 8” x 8” x 6” I Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
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More detailsstepper Location : ASIA (North East)
Price : On request
More detailsBuilt in 1999, this Avant ATS 400 is in complete working order and good condition. It comes with a computer ( Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
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HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.