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Gaertner

Ref : 1825311-9
Condition : Used
Manufacturer : Gaertner
Model : -
Year(s) : -
Quantity : 0
Location : Seller or machines location:
EUROPE (Central and Eastern)
Last check : 04 Oct. 2019

GAERTNER L116-C8 Variable Angle Ellipsometer

Features:
* Automatic highly precise measurements of film thickness and refractive index.
* Tilt-free, focus free, hands-off operation for similar wafers
* 15 Micron measuring spot standard
* Combination tilt/viewing scope standard
* Variable angle for difficulty to measure and near period films
* Trouble-free, no moving parts patentend StokesMeters measurement head
* Simple, compact tabletop instrument
* Wafer size up tu 200mm (8")