Used Metrology and inspection equipment
1,304 resultsSemiprobe wafer prober mounted on Newport table Inspects diced wafers mounted on film frames Wafer stage with Location : AMERICA North (USA-Canada-Mexico)
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More detailsOlympus BFXM optical system with UIS2 optics 2,5x/5x/10x/20x M Plan FL BD Brightfield and darkfield reflected Location : AMERICA North (USA-Canada-Mexico)
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More detailsLarge panel inspection tool transmitted and reflected light observation manual stage with XY travel 56cm (22") Location : AMERICA North (USA-Canada-Mexico)
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More detailsYesVision Software - V2.8.3b Build 6067 Windows Version 7 2D Inspection High Magnification Option 5 Megapixel Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More details150 / 200mm Open Cassette (available with Single LPT 2200 SMIF) Location : EUROPE (Western and Northern)
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More detailsSoftware ATOS2 Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
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More detailsElectrical Specifications • Operating Voltage: 480 V • Control Voltage: 24 V • Nominal Current: 16 A • Frequen Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)
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More detailsCondition: Refurbished Wafer : 12 Inches. Tri-Temp. Temperature : -45°C. It comes with Chiller. Vintage : 2014 Year(s) : 2014 Location : EUROPE (Western and Northern)
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More details• Equipment Type: Manual sheet and bulk resistivity measurement system • Measurement Method: Four-point inline Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe NSX-95 wafer inspection systems provides high-speed wafer inspection for defects down to 0.5 micron (micr Location : AMERICA North (USA-Canada-Mexico)
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More detailsOlympus BXFM inspection microscope with brightfield, darkfield, and DIC Objectives: UM Plan 5x/0.15 BD UM Pla Location : AMERICA North (USA-Canada-Mexico)
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More detailsNikon Eclipse L200 microscope with 5/10/20/50 LU Plan BD objectives for brightfield and darkfield Nikon NWL-8 Location : AMERICA North (USA-Canada-Mexico)
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More detailsPrecitec CHRocodile SE-1000 Interferometric Point Sensor Range: 1.000mm (resolution 0.035um) Measuring Distanc Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe FRT MicroProf 300 is a highly versatile, standalone 3D optical surface metrology tool primarily used for Year(s) : 2023 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrightfield/ Darkfield inspection Tilting ergonomic viewing head with 10x eyepieces 100w Halogen lamphouse for Location : AMERICA North (USA-Canada-Mexico)
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More detailsInspection microscope configured for brightfield, darkfield, and DIC (Nomarski) Z stand with granite base, cou Location : AMERICA North (USA-Canada-Mexico)
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More detailsMX61A-F frame configured for brightfield and darkfield observation Stainless steel table with granite vibratio Location : AMERICA North (USA-Canada-Mexico)
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More detailsS-1160B-4N Precision Manual Analytical Probe Station configured with 4" chuck upgradable to 6" or 8" 2"x2" Mi Location : AMERICA North (USA-Canada-Mexico)
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More detailsZeiss LSM Pascal 5 laser scanning microscope VarioTwo UBG configuration with 3 lasers (HeNe, Ar-Ion, Blue la Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)
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More detailsNikon Eclipse L200N inspection microscope with brightfield and darkfield episcopic illumination Trinocular vi Location : AMERICA North (USA-Canada-Mexico)
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More detailsReflected light observation with brightfield and darkfield 5x/10x/20x/50x LU Plan BD objectives Trinocular vie Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size: 150-300mm Macro defect inspection systems Defect sensitivity to 0.5 microns (user adjustable) Ins Location : AMERICA North (USA-Canada-Mexico)
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More detailsZeiss inspection microscope for large wafers and panels with reflected and transmitted light Brightfield, dark Location : AMERICA North (USA-Canada-Mexico)
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More detailsOlympus BXFM industrial microscope with UIS2 optical system BXFM frame with BFXM-ILH and BXFM-ILHSPU focus blo Location : AMERICA North (USA-Canada-Mexico)
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More detailsLeica MZ9.5 stereozoom with 9.5:1 zoom. Magnifications up to 480x. Trinocular viewing tube Transmitted light Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.