Used Metrology and inspection equipment
1,163 resultsGrid electron microscope Resolution: 1,8 nm at 1kV or 0,5 nm at 30kV Magnification: Low magnification mode: 6 Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsInspection: Wafer Maker KLA-Tencor Model Altair 8900 Year(s) : 2014 Location : ASIA (North East)
Price : On request
More details[Light probe measurement] - Measurable range (XY): 90 x 90 mm - Maximum measurement depth: 30 mm - Light probe Location : ASIA (North East)
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More detailsThin film measurement tool Broadband UV optics Dual beam spectrophotometry Wafer sizes: 100mm, 150mm, and 200m Location : AMERICA North (USA-Canada-Mexico)
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More detailsAOI System Type: 3D AOI Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAOI System Type: 3D AOI Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsUV LC-6 Benchtop Conveyor UV Curing System. Lamp can be rotated and set to any angle to part travel or raised Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel 365 Capabilities: Cures most UV tape in 5 seconds Large exposure area cures up to 300mm wafers. Location : AMERICA North (USA-Canada-Mexico)
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More detailsBandit Rework Station with CD and Manuals USED, AS IS CONDITION Location : AMERICA North (USA-Canada-Mexico)
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More detailsCu Film thickness measurement Version: 300 mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsOptical system: Fiber optic Detector: Semiconductor detector Burner head: Air-cooled titanium burner Nebulizer Year(s) : 2017 Location : ASIA (North East)
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More details- Alignment System MA150e TSA - PC -Aut. Adjustment ( Autoalignment System) Cognex 8100 ( Patmex ) TSA - Lamph Location : EUROPE (Western and Northern)
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More detailsMax PCB: 510 x 510 mm Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsInline AOI 5 Camera Windows 7 DOM: 10/2012 Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMeasurement: Film thickness Location : ASIA (North East)
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More detailsThe S3088-II utilizes high performance Viscom 8M camera technology to meet extreme throughput requirements. Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription: 1 pc. Stereo Microscope Leica 165C Reflected light and transmitted light mi Location : EUROPE (Western and Northern)
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More detailsDescription: Inspection microscopes microscopes microscopes microscopes Longdescription: Inspection microsc Location : EUROPE (Western and Northern)
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More detailsdescription: - the laser is alive it is built for 110V, but we have a generator Year(s) : 2000 Location : EUROPE (Western and Northern)
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More detailsTemperature Shock Chamber Condition: very good Year(s) : 101252 Location : EUROPE (Western and Northern)
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More details300mm Nickel Plated Chuck With H325C Chiller for Tri-Temp Operation (to -25°C) Hinged Test Head Manipulator Year(s) : 2021 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAdvanced 3D slice imaging 86" X 103” dimensions Automated inspection Defect analysis High output x-ray source Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAdvanced 3D slice imaging 61" X 72" dimensions Automated inspection Defect analysis High output x-ray source H Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsRate Voltage: 220 VAC Rate Current: 10A Rate Frequency: 50 Hz Equipped with Panasonic Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More details-CLM 3D Dual Beam FIB-SEM fully automated 3D metrology system. -In-line cross-section metrology -High wafer th Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.