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Used Metrology and inspection equipment

1,297 results
1

Precitec CHRocodile SE-1000 Interferometric Point Sensor Range: 1.000mm (resolution 0.035um) Measuring Distanc Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)

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The FRT MicroProf 300 is a highly versatile, standalone 3D optical surface metrology tool primarily used for Year(s) : 2023 Location : AMERICA North (USA-Canada-Mexico)

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Shadow Proof 3D Sensor 1D/2D Internal Reader Sigmalink Offline Review Software Vision 3D Program Inspection So Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)

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Flying probe tester (FPT) with 16 probes, 8 bottom - 8 top side, alignment system w/ CCD B/W cameras (both s Year(s) : 2000 Location : EUROPE (Western and Northern)

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Malvern Panalytical Omega / Theta XRD X-ray Diffraction System, 6" - 200-240 Vac - 50/60 Hz 2022 Vintage Year(s) : 2022 Location : EUROPE (Western and Northern)

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1

Brightfield/ Darkfield inspection Tilting ergonomic viewing head with 10x eyepieces 100w Halogen lamphouse for Location : AMERICA North (USA-Canada-Mexico)

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Inspection microscope configured for brightfield, darkfield, and DIC (Nomarski) Z stand with granite base, cou Location : AMERICA North (USA-Canada-Mexico)

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MX61A-F frame configured for brightfield and darkfield observation Stainless steel table with granite vibratio Location : AMERICA North (USA-Canada-Mexico)

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Hitachi Scanning Electron Microscope S-3400N Secondary Electron Image Resolution: 3.0nm (High Vacuum Mode), Location : ASIA (North East)

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Viscom S3088‐III AOI Inspection System Power: 2.5 kw 50-60 Hz High‐performance inline AOI system designed for Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Machine is in fully functional condition. Location : AMERICA North (USA-Canada-Mexico)

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S-1160B-4N Precision Manual Analytical Probe Station configured with 4" chuck upgradable to 6" or 8" 2"x2" Mi Location : AMERICA North (USA-Canada-Mexico)

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Zeiss LSM Pascal 5 laser scanning microscope VarioTwo UBG configuration with 3 lasers (HeNe, Ar-Ion, Blue la Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)

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The Vitrox V510XL is an automated optical inspection system used for high-speed visual inspection of printed Year(s) : 2012 Location : EUROPE (Western and Northern)

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<b>1x CyberOptics, 8011843, SPI Inspection Description</b> Dimensions (h x w x d) 200 x 98 x 125 Weight 860 k Location : AMERICA North (USA-Canada-Mexico)

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<b>1x CyberOpticsSE-200, 8002351, Inspection Equipment Description</b> Dimensions (h x w x d) 77.5 x 25.5 x 4 Location : AMERICA North (USA-Canada-Mexico)

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CR Tech CRX-1000 1998 Vintage Open Filament 220v Single Phase Location : AMERICA North (USA-Canada-Mexico)

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Marantz Nspect 14 Inspection Equipment - Solder paste inspection system - fully operational and functional Location : AMERICA North (USA-Canada-Mexico)

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1

Omron VP1000 - 2004 - 3D Paste Inspection System - 2004 Vintage Inspection Equipment Location : AMERICA North (USA-Canada-Mexico)

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OmronVP1000 - 2005 Inspection Equipment - pass through - 2005 vintage - volumized past inspection - capable of Location : AMERICA North (USA-Canada-Mexico)

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1

Electrovert Aquastorm 200 - 1997 vintage - 10 hp pumps - 15 hp blowers - checkmate conveyor - ISO chemical iso Location : AMERICA North (USA-Canada-Mexico)

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<b>1x Wentworth, MP 1301, Manual Probe Description</b> 6" CHUCK GOLD PLATED CHESSMAN MANIPULATOR Bausch & Lom Location : EUROPE (Western and Northern)

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<b>1x Veeco, 4 point, probe Description</b> 3" system Location : EUROPE (Western and Northern)

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<b>1x Tencor, Alpha Step 100, surface measurment Description</b> Throat depth 2.54" allowing measurment on a Location : EUROPE (Western and Northern)

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<b>1x Tencor, Alpha Step 200, surface profile Description</b> good condition , fully working and tested. Location : EUROPE (Western and Northern)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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