Used Metrology and inspection equipment
1,299 resultsThe NSX-95 wafer inspection systems provides high-speed wafer inspection for defects down to 0.5 micron (micr Location : AMERICA North (USA-Canada-Mexico)
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More detailsOlympus BXFM inspection microscope with brightfield, darkfield, and DIC Objectives: UM Plan 5x/0.15 BD UM Pla Location : AMERICA North (USA-Canada-Mexico)
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More detailsNikon Eclipse L200 microscope with 5/10/20/50 LU Plan BD objectives for brightfield and darkfield Nikon NWL-8 Location : AMERICA North (USA-Canada-Mexico)
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More detailsPrecitec CHRocodile SE-1000 Interferometric Point Sensor Range: 1.000mm (resolution 0.035um) Measuring Distanc Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe FRT MicroProf 300 is a highly versatile, standalone 3D optical surface metrology tool primarily used for Year(s) : 2023 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrightfield/ Darkfield inspection Tilting ergonomic viewing head with 10x eyepieces 100w Halogen lamphouse for Location : AMERICA North (USA-Canada-Mexico)
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More detailsInspection microscope configured for brightfield, darkfield, and DIC (Nomarski) Z stand with granite base, cou Location : AMERICA North (USA-Canada-Mexico)
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More detailsMX61A-F frame configured for brightfield and darkfield observation Stainless steel table with granite vibratio Location : AMERICA North (USA-Canada-Mexico)
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More detailsS-1160B-4N Precision Manual Analytical Probe Station configured with 4" chuck upgradable to 6" or 8" 2"x2" Mi Location : AMERICA North (USA-Canada-Mexico)
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More detailsZeiss LSM Pascal 5 laser scanning microscope VarioTwo UBG configuration with 3 lasers (HeNe, Ar-Ion, Blue la Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)
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More detailsNikon Eclipse L200N inspection microscope with brightfield and darkfield episcopic illumination Trinocular vi Location : AMERICA North (USA-Canada-Mexico)
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More detailsReflected light observation with brightfield and darkfield 5x/10x/20x/50x LU Plan BD objectives Trinocular vie Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size: 150-300mm Macro defect inspection systems Defect sensitivity to 0.5 microns (user adjustable) Ins Location : AMERICA North (USA-Canada-Mexico)
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More detailsZeiss inspection microscope for large wafers and panels with reflected and transmitted light Brightfield, dark Location : AMERICA North (USA-Canada-Mexico)
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More detailsOlympus BXFM industrial microscope with UIS2 optical system BXFM frame with BFXM-ILH and BXFM-ILHSPU focus blo Location : AMERICA North (USA-Canada-Mexico)
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More detailsLeica MZ9.5 stereozoom with 9.5:1 zoom. Magnifications up to 480x. Trinocular viewing tube Transmitted light Location : AMERICA North (USA-Canada-Mexico)
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More detailsPneumatic microscope lift Motic PSM1000 stereozoom microscope Motic Fiber illuminator 150mm thermal vacuum chu Location : AMERICA North (USA-Canada-Mexico)
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More details408nm GaN (Gallium Nitride) blue laser confocal microscope for CD measurement and surface profilingSemprex 20 Location : AMERICA North (USA-Canada-Mexico)
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More detailsReflected light microscope configured for brightfield, darkfield, and DIC ( Nomarkski) inspection stage has 6 Location : AMERICA North (USA-Canada-Mexico)
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More detailsConfigured for reflected light, brightfield, darkfield. 12v/100w lamphouses (pnU-ULS100H), XY stage travel 52 Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe KLA Tencor P10 is a manual-load stylus profiler primarily used for measuring surface characteristics like Location : AMERICA North (USA-Canada-Mexico)
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More detailsIncludes 4 position objective turret and autofocus Motorized auto stage with 200mm x 200mm travel (8"x8") Prof Year(s) : 2024 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription: Delta 80+ photoresist coater Gyrset closed cover coating technology Wafer size up to 200mm 2 Waf Location : AMERICA North (USA-Canada-Mexico)
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More detailsFACTS 2 Acoustic Scanning Microscope, model DF2200, 110v Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSemiautomatic prober with 150mm (6â€) nickel plated vacuum chuck. B&L Microzoom II microscope with 2.5, 8x, 2 Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.