Used Metrology and inspection equipment
1,265 resultsVintage : OCT 2013 14" x 14" Work Area 208V 1 Phase 50/60Hz Specifications ( See Details above for installed Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThe Keyence VHX-600E Digital Microscope is an advanced visible light microscope with the following advantages Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. C Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSold in good working condition Refurbished WaferMark Sigmaclean Laser Marking Machine Vintage:2001 With Ultra Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsThis JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope was removed from a university lab wh Year(s) : 1993 Location : EUROPE (Western and Northern)
Price : On request
More detailsInverted Fluorescence Motorised Microscope Model Observer.Z1 Location : EUROPE (Western and Northern)
Price : On request
More detailsThis Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it was surplus Location : EUROPE (Western and Northern)
Price : On request
More detailsProber/12in Year(s) : 2005 Location : ASIA (North East)
Price : On request
More detailsSCARA Robot/YK-XG Year(s) : 2019 Location : ASIA (North East)
Price : On request
More detailsSignatone CM100 manual prober Analytical probe station with submicron resolution Manual control of wafer stage Location : EUROPE (Western and Northern)
Price : On request
More details• Software: UV WINLAB V6.4 • Detector: 2D Detector Module • Optical design: True double-beam, double-monochrom Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details• Spectral range: 175–3300 nm • Detector: Gridless PMT with Peltier-controlled PbS • UV/Vis resolution: 0.05 n Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details• Includes: Camera and monitor • Magnification range: 7X to 115X • Nosepiece: Revolving type, supports two obj Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMetrology Equipment Year(s) : 2014 Location : EUROPE (Western and Northern)
Price : On request
More detailsStepper Year(s) : 2012 Location : ASIA (North East)
Price : On request
More detailsPower: 220VAC, 1ph, 50/60 Hz 8 Way 3D Camera / Projection System Max Board Size: approx. 850 × 690 mm Automati Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVintage : AUG 2013 14" x 14" Work Area 203V Specifications ( See Details above for installed options ) The Mi Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMirtec MV-3L Benchtop AOI 5 Cameras DOM: 02/2018 Windows 7 - SW: Mirtec Inspector 5.5.400.327 5 Cameras: Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYESTECH Nordson YTV-FX 2014 Inline AOI, 5 Camera Windows 7 YesVision V2.8.0 DOM: 6/2013 Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope Location : ASIA (North East)
Price : On request
More detailsMicroscope Location : ASIA (North East)
Price : On request
More detailsStepper Year(s) : 2013 Location : ASIA (North East)
Price : On request
More detailsOnly 100 working Hours, Open to best offers Year(s) : 2019 Location : EUROPE (Western and Northern)
Price : On request
More detailsMicroscope Location : ASIA (North East)
Price : On request
More detailsKLA-Tencor P-6 Surface Profiler consisting of: - Manufacturer: KLA-Tencor - Model: P6 - Measurement Type Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.